Inventor · disambiguated record
Kelly Hurley
Also filed as: HURLEY KELLY · HURLEY KELLY T · LI LI
22 granted patents·6 pending applications·413 citations·filing 1995–2017
96Inventor score
Top patents by PatentIndex Score
28 records- 0193US5939333ASilicon nitride deposition methodMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 17, 1999·107 cites·6 claims
- 0292US6624022B1Method of forming FLASH memoryMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 23, 2003·41 cites·35 claims
- 0384US6808989B2Self-aligned floating gate flash cell system and methodMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 26, 2004·20 cites·33 claims
- 0482US6127287ASilicon nitride deposition method for use in forming a memory cell dielectricMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 3, 2000·45 cites·21 claims
- 0581US6690051B2FLASH memory circuitryMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 10, 2004·18 cites·10 claims
- 0681US6204206B1Silicon nitride deposition methodMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 20, 2001·44 cites·12 claims
- 0780US7271060B2Semiconductor processing methodsMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 18, 2007·10 cites·25 claims
- 0879US6706594B2Optimized flash memory cellMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 16, 2004·18 cites·20 claims
- 0979US6350708B1Silicon nitride deposition methodMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 26, 2002·15 cites·31 claims
- 1071US6297092B1Method and structure for an oxide layer overlaying an oxidation-resistant layerMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 2, 2001·23 cites·23 claims
- 1170US6759708B2Stacked gate region of a nonvolatile memory cell for a computerMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 6, 2004·8 cites·41 claims
- 1270US6674145B2Flash memory circuitryMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 6, 2004·9 cites·6 claims
- 1369US6756268B2Modified source/drain re-oxidation method and systemMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 29, 2004·8 cites·35 claims
- 1467US7091087B2Optimized flash memory cellMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 15, 2006·9 cites·6 claims
- 1562US6949792B2Stacked gate region of a memory cell in a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 27, 2005·5 cites·33 claims
- 1660US6790721B2Metal local interconnect self-aligned source flash cellMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 14, 2004·9 cites·11 claims
- 1753US6653683B2Method and structure for an oxide layer overlying an oxidation-resistant layerMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 25, 2003·4 cites·3 claims
- 1846US2005272203A1Modified source/drain re-oxidation method and systemRUDECK PAUL J·Filed 2005·Application pending·0 cites
- 1945US7037860B2Modified source/drain re-oxidation method and systemMICRON TECHNOLOGY INC·Filed 2004·Granted May 2, 2006·0 cites·32 claims
- 2044US6387777B1Variable temperature LOCOS processFiled 1998·Granted May 14, 2002·11 cites·26 claims
- 2144US2018338585A1Removable fastener for embellishing, branding, joining, gathering and tailoring clothing and commercial textile itemsHURLEY KELLY·Filed 2017·Application pending·0 cites
- 2243US7271435B2Modified source/drain re-oxidation method and systemMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 18, 2007·0 cites·12 claims
- 2341US2002096707A1Modified source/drain re-oxidation method and systemFiled 2001·Application pending·0 cites
- 2439US2004113196A1Method and structure for an oxide layer overlying an oxidation-resistant layerFiled 2003·Application pending·0 cites
- 2537US5578505AMethods for measuring the surface area of a semiconductor waferMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 26, 1996·5 cites·20 claims
- 2637US2002130357A1Self-aligned floating gate flash cell system and methodFiled 2001·Application pending·0 cites
- 2736US5899702AMethods for measuring surface areaMICRON TECHNOLOGY INC·Filed 1996·Granted May 4, 1999·4 cites·23 claims
- 2832US2003011018A1Flash floating gate using epitaxial overgrowthFiled 2001·Application pending·0 cites
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