Inventor · disambiguated record
Eli Haimovich
Also filed as: HAIMOVICH ELI
4 granted patents·121 citations·filing 1995–2001
79Inventor score
Technology areasH10P
Files withNOVA MEASURING INSTR LTD4
Top patents by PatentIndex Score
4 records- 0188US6045433AApparatus for optical inspection of wafers during polishingNOVA MEASURING INSTR LTD·Filed 1995·Granted Apr 4, 2000·91 cites·4 claims
- 0280US6368181B1Apparatus for optical inspection of wafers during polishingNOVA MEASURING INSTR LTD·Filed 2000·Granted Apr 9, 2002·19 cites·15 claims
- 0356US6543461B2Buffer system for a wafer handling system field of the inventionNOVA MEASURING INSTR LTD·Filed 2000·Granted Apr 8, 2003·6 cites·14 claims
- 0451US6368182B2Apparatus for optical inspection of wafers during polishingNOVA MEASURING INSTR LTD·Filed 2001·Granted Apr 9, 2002·5 cites·23 claims
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