Inventor · disambiguated record
Martin Sellen
Also filed as: SELLEN MARTIN
9 granted patents·1 pending application·156 citations·filing 1994–2007
88Inventor score
Top patents by PatentIndex Score
10 records- 0190US7061230B2Circuit and method for measuring distancesMICRO EPSILON MESSTECHNIK·Filed 2004·Granted Jun 13, 2006·54 cites·26 claims
- 0283US7602175B2Non-contacting position measuring systemMICRO EPSILON MESSTECHNIK·Filed 2006·Granted Oct 13, 2009·14 cites·21 claims
- 0376US7345471B2Device and method for detecting the position and the velocity of a test objectMICRO EPSILON MESSTECHNIK·Filed 2007·Granted Mar 18, 2008·10 cites·37 claims
- 0472US5559431AMethod of calibrating a sensorMICRO EPSILON MESSTECHNIK·Filed 1994·Granted Sep 24, 1996·39 cites·18 claims
- 0553US8198888B2Method and system for determining the distance between a profiled surface and a functional surface moving in relation thereto by using measurement coils and a reference coilGROEMMER WERNER·Filed 2005·Granted Jun 12, 2012·4 cites·16 claims
- 0645US6999892B2Circuit arrangement and method for controlling and evaluating signal detectorsMICRO EPSILON MESSTECHNIK·Filed 2002·Granted Feb 14, 2006·2 cites·27 claims
- 0742US7012462B2Demodulation circuitMICRO EPSILON MESSTECHNIK·Filed 2003·Granted Mar 14, 2006·2 cites·22 claims
- 0840US2008039867A1Actuator Platform For Guiding End Effectors In Minimally Invasive InterventionsMICRO EPSILON MESSTECHNIK·Filed 2004·Application pending·0 cites
- 0935US6318153B1Non-contact film thickness gauging sensorMICRO EPSILON MESSTECHNIK·Filed 1996·Granted Nov 20, 2001·31 cites·13 claims
- 1027US7275015B2Method and device for determining motion parameters of a conductive, profiled surfaceMICRO EPSILON MESSTECHNIK·Filed 2005·Granted Sep 25, 2007·0 cites·28 claims
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