Inventor · disambiguated record
Manjul Bhushan
Also filed as: BHUSHAN MANJUL
28 granted patents·1 pending application·296 citations·filing 1980–2012
96Inventor score
Top patents by PatentIndex Score
29 records- 0195US7190233B2Methods and apparatus for measuring change in performance of ring oscillator circuitIBM·Filed 2005·Granted Mar 13, 2007·35 cites·28 claims
- 0286US7504875B2Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuitIBM·Filed 2007·Granted Mar 17, 2009·10 cites·20 claims
- 0386US7295057B2Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuitIBM·Filed 2005·Granted Nov 13, 2007·11 cites·18 claims
- 0486US7265639B2Methods and apparatus for ring oscillator based MOSFET gate capacitance measurementsIBM·Filed 2005·Granted Sep 4, 2007·14 cites·21 claims
- 0585US6798261B1Method and apparatus for characterizing switching history impactIBM·Filed 2003·Granted Sep 28, 2004·31 cites·27 claims
- 0684US6960926B2Method and apparatus for characterizing a circuit with multiple inputsIBM·Filed 2002·Granted Nov 1, 2005·29 cites·26 claims
- 0782US4342879AThin film photovoltaic deviceUNIV DELAWARE·Filed 1980·Granted Aug 3, 1982·45 cites·8 claims
- 0881US4443653AThin film photovoltaic device with multilayer substrateUNIV DELAWARE·Filed 1982·Granted Apr 17, 1984·42 cites·26 claims
- 0979US7069525B2Method and apparatus for determining characteristics of MOS devicesIBM·Filed 2003·Granted Jun 27, 2006·22 cites·31 claims
- 1076US8589842B1Device-based random variability modeling in timing analysisIBM·Filed 2012·Granted Nov 19, 2013·4 cites·20 claims
- 1175US8456169B2High speed measurement of random variation/yield in integrated circuit device testingBHUSHAN MANJUL·Filed 2010·Granted Jun 4, 2013·3 cites·20 claims
- 1275US7355902B2Methods and apparatus for inline characterization of high speed operating margins of a storage elementIBM·Filed 2006·Granted Apr 8, 2008·9 cites·20 claims
- 1375US7176695B2Method and apparatus for measuring transfer characteristics of a semiconductor deviceIBM·Filed 2006·Granted Feb 13, 2007·6 cites·20 claims
- 1473US7504896B2Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technologyIBM·Filed 2006·Granted Mar 17, 2009·7 cites·13 claims
- 1571US7085658B2Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chipsIBM·Filed 2004·Granted Aug 1, 2006·14 cites·74 claims
- 1664US8248094B2Acquisition of silicon-on-insulator switching history effects statisticsBHUSHAN MANJUL·Filed 2009·Granted Aug 21, 2012·4 cites·20 claims
- 1763US8179120B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2009·Granted May 15, 2012·3 cites·16 claims
- 1862US7512509B2M1 testable addressable array for device parameter characterizationIBM·Filed 2007·Granted Mar 31, 2009·3 cites·20 claims
- 1957US7342406B2Methods and apparatus for inline variability measurement of integrated circuit componentsIBM·Filed 2005·Granted Mar 11, 2008·2 cites·15 claims
- 2055US8310269B2Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditionsBHUSHAN MANJUL·Filed 2009·Granted Nov 13, 2012·2 cites·22 claims
- 2150US9194909B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Nov 24, 2015·0 cites·11 claims
- 2250US9075109B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Jul 7, 2015·0 cites·11 claims
- 2347US7583125B2Methods and apparatus for pulse generation used in characterizing electronic fusesIBM·Filed 2007·Granted Sep 1, 2009·0 cites·14 claims
- 2446US7595654B2Methods and apparatus for inline variability measurement of integrated circuit componentsIBM·Filed 2008·Granted Sep 29, 2009·0 cites·8 claims
- 2545US9110777B2Reducing performance degradation in backup semiconductor chipsBANSAL ADITYA·Filed 2012·Granted Aug 18, 2015·0 cites·14 claims
- 2642US8027797B2Methods and apparatus for determining a switching history time constant in an integrated circuit deviceIBM·Filed 2008·Granted Sep 27, 2011·0 cites·20 claims
- 2740US7145347B2Method and apparatus for measuring transfer characteristics of a semiconductor deviceIBM·Filed 2004·Granted Dec 5, 2006·0 cites·20 claims
- 2839US8723528B2Active 2-dimensional array structure for parallel testingKETCHEN MARK B·Filed 2011·Granted May 13, 2014·0 cites·20 claims
- 2939US2012256651A1Test structure for parallel test implemented with one metal layerBHUSHAN MANJUL·Filed 2011·Application pending·0 cites
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