Inventor · disambiguated record
Tatsuo Fukui
Also filed as: FUKUI TATSUO
21 granted patents·4 pending applications·301 citations·filing 1993–2021
95Inventor score
Top patents by PatentIndex Score
25 records- 0193US6760146B2Light modulation element, GLV device, and laser displaySONY CORP·Filed 2002·Granted Jul 6, 2004·61 cites·5 claims
- 0286US7456967B2Mark position detection apparatusNIKON CORP·Filed 2006·Granted Nov 25, 2008·7 cites·9 claims
- 0385US7528954B2Method of adjusting optical imaging system, positional deviation detecting mark, method of detecting positional deviation, method of detecting position, position detecting device and mark identifying deviceNIKON CORP·Filed 2006·Granted May 5, 2009·8 cites·5 claims
- 0484US6055029ABacklighting system for a liquid crystal display including an integrally molded light guiding plate and frame with a deformation absorbing meansSTANLEY ELECTRIC CO LTD·Filed 1997·Granted Apr 25, 2000·87 cites·7 claims
- 0579US6975399B2mark position detecting apparatusNIKON CORP·Filed 2002·Granted Dec 13, 2005·17 cites·19 claims
- 0674US6885450B2Apparatus for detecting optical positional deviationNIKON CORP·Filed 2001·Granted Apr 26, 2005·17 cites·8 claims
- 0772US7580121B2Focal point detection apparatusNIKON CORP·Filed 2005·Granted Aug 25, 2009·3 cites·2 claims
- 0871US10725278B2Microscope, observation method, and storage mediumNIKON CORP·Filed 2018·Granted Jul 28, 2020·1 cites·52 claims
- 0970US8547559B2Detection method and detection apparatusKITO YOSHIAKI·Filed 2012·Granted Oct 1, 2013·2 cites·20 claims
- 1068US8520188B2Illumination apparatus for efficiently gathering illumination lightFUKUI TATSUO·Filed 2010·Granted Aug 27, 2013·2 cites·20 claims
- 1166US6668075B1Position detection apparatus and methodNIKON CORP·Filed 1999·Granted Dec 23, 2003·42 cites·48 claims
- 1262US7197176B2Mark position detecting apparatus and mark position detecting methodNIKON CORP·Filed 2003·Granted Mar 27, 2007·8 cites·10 claims
- 1361US2018275061A1Microscope apparatusNIKON CORP·Filed 2018·Application pending·0 cites
- 1457US11906431B2Microscope apparatusNIKON CORP·Filed 2021·Granted Feb 20, 2024·0 cites·14 claims
- 1555US8994957B2Detection method and detection apparatusNIKON CORP·Filed 2013·Granted Mar 31, 2015·0 cites·20 claims
- 1655US5370076AMethod of producing single crystal of KTiOPO4SONY CORP·Filed 1993·Granted Dec 6, 1994·11 cites·8 claims
- 1753US8867019B2Projection optical system, exposure apparatus, exposure method, display manufacturing method, mask, and mask manufacturing methodNIKON CORP·Filed 2012·Granted Oct 21, 2014·0 cites·23 claims
- 1853US6146251APolishing method, method of manufacturing an optical device, and a liquid suspension used for polishingSONY CORP·Filed 1999·Granted Nov 14, 2000·9 cites·13 claims
- 1952US6240111B1Laser beam generating apparatus and methodSONY CORP·Filed 1999·Granted May 29, 2001·18 cites·14 claims
- 2050US8305556B2Projection optical system, exposure apparatus, exposure method, display manufacturing method, mask, and mask manufacturing methodKUMAZAWA MASATO·Filed 2008·Granted Nov 6, 2012·0 cites·9 claims
- 2142US2004227944A1Mark position detection apparatusNIKON CORP·Filed 2004·Application pending·0 cites
- 2242US2006082775A1Mark position detecting apparatusNIKON CORP·Filed 2005·Application pending·0 cites
- 2341US7212559B2Optical resonator and laser oscillatorSONY CORP·Filed 2004·Granted May 1, 2007·0 cites·7 claims
- 2441US5526169AElectro-optical modulatorSONY CORP·Filed 1994·Granted Jun 11, 1996·8 cites·8 claims
- 2536US2002060793A1Optical positional displacement measuring apparatus and adjustment method thereofNIKON CORP·Filed 2001·Application pending·0 cites
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