Inventor · disambiguated record
Bok Nam Song
Also filed as: SONG BOK N · SONG BOK NAM
11 granted patents·343 citations·filing 1994–2007
92Inventor score
Files withHYUNDAI ELECTRONICS IND5DAEWOO ELECTRONICS CO LTD4NAT UNIV CHUNGBUK IND ACAD1SONG BOK NAM1
Top patents by PatentIndex Score
11 records- 0192US5812449AFlash EEPROM cell, method of manufacturing the same, method of programming and method of reading the sameHYUNDAI ELECTRONICS IND·Filed 1996·Granted Sep 22, 1998·130 cites·2 claims
- 0288US6003182AMethod for maintaining set temperature of wash water of clothes washerDAEWOO ELECTRONICS CO LTD·Filed 1998·Granted Dec 21, 1999·61 cites·7 claims
- 0382US5616942AFlash EEPROM cell and manufacturing methods thereofHYUNDAI ELECTRONICS IND·Filed 1996·Granted Apr 1, 1997·47 cites·1 claims
- 0482US5504954AWashing method for washing clothes made of wool or silkDAEWOO ELECTRONICS CO LTD·Filed 1994·Granted Apr 9, 1996·42 cites·20 claims
- 0557US6229736B1Method of erasing flash memory and substrate voltage supply circuitHYUNDAI ELECTRONICS IND·Filed 1999·Granted May 8, 2001·17 cites·16 claims
- 0653US5714939AMethod of detecting the clogging of a filter installed in a washing machineDAEWOO ELECTRONICS CO LTD·Filed 1996·Granted Feb 3, 1998·15 cites·10 claims
- 0750US5520025AWashing machine for washing clothes made of wool or silkDAEWOO ELECTRONICS CO LTD·Filed 1995·Granted May 28, 1996·13 cites·4 claims
- 0848US8031512B2Multiple-valued DRAMNAT UNIV CHUNGBUK IND ACAD·Filed 2006·Granted Oct 4, 2011·2 cites·6 claims
- 0945US5699296AThreshold voltage verification circuit of a non-volatile memory cell and program and erasure verification method using the sameHYUNDAI ELECTRONICS IND·Filed 1996·Granted Dec 16, 1997·10 cites·11 claims
- 1039US8059451B2Multiple valued dynamic random access memory cell and thereof array using single electron transistorSONG BOK NAM·Filed 2007·Granted Nov 15, 2011·1 cites·18 claims
- 1137US5959893AMethod of erasing a flash memory deviceHYUNDAI ELECTRONICS IND·Filed 1997·Granted Sep 28, 1999·5 cites·2 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →