Inventor · disambiguated record
Hyakka Nakada
Also filed as: NAKADA HYAKKA
12 granted patents·5 pending applications·9 citations·filing 2018–2023
83Inventor score
Top patents by PatentIndex Score
17 records- 0190US11907235B2Plasma processing apparatus including predictive controlHITACHI HIGH TECH CORP·Filed 2021·Granted Feb 20, 2024·2 cites·3 claims
- 0281US11657059B2Search device, searching method, and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted May 23, 2023·2 cites·5 claims
- 0380US11152237B2Substitute sample, method for determining control parameter of processing, and measurement systemHITACHI LTD·Filed 2019·Granted Oct 19, 2021·2 cites·13 claims
- 0471US2023222131A1Search device, searching method, and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0570US10627788B2Retrieval apparatus and retrieval method for semiconductor device processingHITACHI LTD·Filed 2018·Granted Apr 21, 2020·1 cites·15 claims
- 0669US11393084B2Processing recipe generation deviceHITACHI LTD·Filed 2018·Granted Jul 19, 2022·1 cites·10 claims
- 0765US11287782B2Computer, method for determining processing control parameter, substitute sample, measurement system, and measurement methodHITACHI LTD·Filed 2018·Granted Mar 29, 2022·1 cites·10 claims
- 0858US2024353803A1Computer system and apparatus condition search support methodHITACHI LTD·Filed 2022·Application pending·0 cites
- 0955US12094146B2Contour analysis apparatus, processing condition determination system, shape estimation system, semiconductor device manufacturing system, search apparatus, and data structure used in themHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 17, 2024·0 cites·13 claims
- 1055US12036609B2Additive manufacturing condition search apparatus, additive manufacturing condition search method, and reference sampleHITACHI LTD·Filed 2021·Granted Jul 16, 2024·0 cites·7 claims
- 1154US2024362526A1Information processing system and processing condition determination systemHITACHI LTD·Filed 2022·Application pending·0 cites
- 1253US2025077885A1Search apparatus, search method, and semiconductor device manufacturing systemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1351US11112775B2System and method of determining processing conditionHITACHI LTD·Filed 2019·Granted Sep 7, 2021·0 cites·10 claims
- 1449US2024200938A1Contour line analysis apparatus, processing dimension extraction system, processing condition decision system, semiconductor device manufacturing system, and data structureHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1548US11609188B2Processing condition determination system and processing condition searching methodHITACHI LTD·Filed 2021·Granted Mar 21, 2023·0 cites·14 claims
- 1646US12511574B2Processing condition search device and processing condition search methodHITACHI LTD·Filed 2021·Granted Dec 30, 2025·0 cites·11 claims
- 1746US11189470B2Search device, search method and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 30, 2021·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →