Inventor · disambiguated record
Gwang Sik Park
Also filed as: PARK GWANG SIK
3 granted patents·1 pending application·5 citations·filing 2004–2022
56Inventor score
Top patents by PatentIndex Score
4 records- 0184US10082662B23D refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereofKOREA ADVANCED INST SCI & TECH·Filed 2016·Granted Sep 25, 2018·3 cites·12 claims
- 0277US10955360B2Structured illumination-based inspection apparatus and inspection method, and semiconductor device fabrication method including structured illumination-based inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 23, 2021·2 cites·12 claims
- 0351US12345521B2Optical measurement apparatus, measuring method using the same, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 1, 2025·0 cites·20 claims
- 0430US2005031303A1Method for managing bookmark information and method for reproducing content using the sameFiled 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →