Inventor · disambiguated record
Tetsuya Kokubun
Also filed as: KOKUBUN TETSUYA
9 granted patents·1 pending application·288 citations·filing 1994–2018
87Inventor score
Top patents by PatentIndex Score
10 records- 0195US7376931B2Method for providing layout design and photo maskNEC ELECTRONICS CORP·Filed 2004·Granted May 20, 2008·183 cites·16 claims
- 0281US6124613ASOI-MOS field effect transistor that withdraws excess carrier through a carrier path silicon layerNEC CORP·Filed 1998·Granted Sep 26, 2000·56 cites·61 claims
- 0360US6008716AFuse structure connecting first level and second level interconnections in inter-layer insulatorNEC CORP·Filed 1998·Granted Dec 28, 1999·28 cites·43 claims
- 0447US6413808B1Semiconductor device and process for production thereofNEC CORP·Filed 2000·Granted Jul 2, 2002·4 cites·7 claims
- 0541US5712492ATransistor for checking radiation-hardened transistorNEC CORP·Filed 1996·Granted Jan 27, 1998·11 cites·6 claims
- 0640US10664370B2Multiple core analysis mode for defect analysisRENESAS ELECTRONICS CORP·Filed 2018·Granted May 26, 2020·0 cites·12 claims
- 0739US10656201B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted May 19, 2020·0 cites·15 claims
- 0837US2018364297A1Semiconductor device and method of testing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Application pending·0 cites
- 0931US5498894ASemiconductor deviceNEC CORP·Filed 1994·Granted Mar 12, 1996·5 cites·3 claims
- 1028US5675171AIntegrated insulated gate field effect transistors with thin insulation region between field insulation regionsNEC CORP·Filed 1996·Granted Oct 7, 1997·1 cites·6 claims
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