Inventor · disambiguated record
Uwe Wellhausen
Also filed as: WELLHAUSEN UWE
13 granted patents·5 pending applications·59 citations·filing 2002–2006
90Inventor score
Top patents by PatentIndex Score
18 records- 0175US7393756B2Method for fabricating a trench isolation structure having a high aspect ratioINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 1, 2008·7 cites·20 claims
- 0273US7405089B2Method and apparatus for measuring a surface profile of a sampleINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 29, 2008·5 cites·21 claims
- 0371US7371657B2Method for forming an isolating trench with a dielectric materialINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·7 cites·21 claims
- 0461US7300855B2Reversible oxidation protection of microcomponentsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 27, 2007·1 cites·22 claims
- 0558US7378700B2Self-aligned V0-contact for cell size reductionINFINEON TECHNOLOGIES AG·Filed 2006·Granted May 27, 2008·1 cites·10 claims
- 0656US6815234B2Reducing stress in integrated circuitsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 9, 2004·8 cites·10 claims
- 0755US6858890B2Ferroelectric memory integrated circuit with improved reliabilityINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 22, 2005·9 cites·15 claims
- 0852US6940111B2Radiation protection in integrated circuitsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 6, 2005·5 cites·13 claims
- 0951US6946735B2Side-wall barrier structure and method of fabricationINFINEON AG·Filed 2002·Granted Sep 20, 2005·5 cites·15 claims
- 1051US6858442B2Ferroelectric memory integrated circuit with improved reliabilityINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 22, 2005·5 cites·31 claims
- 1147US7101785B2Formation of a contact in a device, and the device including the contactINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 5, 2006·3 cites·7 claims
- 1244US7061035B2Self-aligned V0-contact for cell size reductionINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 13, 2006·1 cites·1 claims
- 1344US6839220B1Multi-layer barrier allowing recovery anneal for ferroelectric capacitorsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 4, 2005·2 cites·16 claims
- 1440US2006003542A1Method of oxidizing object to be processed and oxidation systemSUZUKI KEISUKE·Filed 2005·Application pending·0 cites
- 1537US2004171274A1Method for formation of hardmask elements during a semiconductor device fabrication processFiled 2003·Application pending·0 cites
- 1636US2004087080A1Methods for producing thin layers, such as for use in integrated circuitsFiled 2002·Application pending·0 cites
- 1736US2005037521A1Methods and apparatus for processing semiconductor devices by gas annealingFiled 2003·Application pending·0 cites
- 1834US2004201049A1Suppression of electrode re-crystallisation in a ferrocapacitorFiled 2003·Application pending·0 cites
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