Inventor · disambiguated record
Akihiko Tsuzumitani
Also filed as: TSUZUMITANI AKIHIKO
16 granted patents·5 pending applications·124 citations·filing 2000–2011
92Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD13PANASONIC CORP4KANEGAE KENSHI1MATSUSHITA ELECTRONICS CORP1
Top patents by PatentIndex Score
21 records- 0186US6642564B2Semiconductor memory and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Nov 4, 2003·34 cites·12 claims
- 0275US6265262B1Semiconductor device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jul 24, 2001·20 cites·10 claims
- 0373US6645807B2Method for manufacturing semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Nov 11, 2003·16 cites·8 claims
- 0471US7361932B2Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Apr 22, 2008·4 cites·4 claims
- 0570US6762445B2DRAM memory cell with dummy lower electrode for connection between upper electrode and upper layer interconnectMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jul 13, 2004·15 cites·11 claims
- 0669US6436786B1Method for fabricating a semiconductor deviceMATSUSHITA ELECTRONICS CORP·Filed 2000·Granted Aug 20, 2002·12 cites·8 claims
- 0766US6773979B2Method for fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 10, 2004·10 cites·12 claims
- 0863US7879661B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2008·Granted Feb 1, 2011·2 cites·4 claims
- 0959US7973367B2Semiconductor device and manufacturing method thereofPANASONIC CORP·Filed 2009·Granted Jul 5, 2011·0 cites·27 claims
- 1056US6784474B2Semiconductor memory device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Aug 31, 2004·7 cites·12 claims
- 1151US7663191B2Semiconductor device and manufacturing method thereof with rounded gate including a silicide on the top and at the cornersPANASONIC CORP·Filed 2005·Granted Feb 16, 2010·0 cites·18 claims
- 1250US8242567B2Semiconductor device and manufacturing method thereofKANEGAE KENSHI·Filed 2011·Granted Aug 14, 2012·0 cites·8 claims
- 1347US7202095B2Method for measuring silicide proportion, method for measuring annealing temperature, method for fabricating semiconductor device and x-ray photo receiverMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Apr 10, 2007·0 cites·8 claims
- 1446US6884674B2Method for fabricating a semiconductor device including a capacitance insulating film having a perovskite structureMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Apr 26, 2005·1 cites·8 claims
- 1546US6531729B2Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 11, 2003·2 cites·6 claims
- 1645US2010078730A1Semiconductor device and manufacturing method thereofPANASONIC CORP·Filed 2009·Application pending·0 cites
- 1743US6916705B2Semiconductor memory and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jul 12, 2005·1 cites·6 claims
- 1843US2003230480A1Method for depositing sputtered filmMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Application pending·0 cites
- 1938US2007138573A1Semiconductor device and manufacturing method of the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 2034US2002197793A1Low thermal budget metal oxide deposition for capacitor structuresFiled 2001·Application pending·0 cites
- 2133US2002037624A1Capacitor and method for fabricating semiconductor deviceFiled 2001·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →