Inventor · disambiguated record
Hyun Jo Yang
Also filed as: YANG HYUN · YANG HYUN JO
12 granted patents·3 pending applications·142 citations·filing 1996–2024
89Inventor score
Files withHYNIX SEMICONDUCTOR INC6YANG HYUN JO4HYUNDAI ELECTRONICS IND3LG SEMICON CO LTD1SAMSUNG ELECTRONICS CO LTD1
Top patents by PatentIndex Score
15 records- 0193US7752584B2Method for verifying mask pattern of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jul 6, 2010·36 cites·18 claims
- 0278US5888674AMethod of manufacturing a halftone phase shift maskLG SEMICON CO LTD·Filed 1996·Granted Mar 30, 1999·42 cites·35 claims
- 0373US8884436B2Semiconductor device, memory system and method of manufacturing the semiconductor deviceYANG HYUN JO·Filed 2012·Granted Nov 11, 2014·3 cites·20 claims
- 0473US6387759B1Method of fabricating a semiconductor deviceHYUNDAI ELECTRONICS IND·Filed 1999·Granted May 14, 2002·36 cites·22 claims
- 0567US8298956B2Method for fabricating fine patternYANG HYUN JO·Filed 2011·Granted Oct 30, 2012·2 cites·16 claims
- 0665US8444867B2Method for fabricating patterns on a wafer through an exposure processYANG HYUN JO·Filed 2009·Granted May 21, 2013·2 cites·20 claims
- 0758US6218082B1Method for patterning a photoresistHYUNDAI ELECTRONICS IND·Filed 1998·Granted Apr 17, 2001·18 cites·21 claims
- 0850USRE44221EMethod for verifying mask pattern of semiconductor deviceYANG HYUN JO·Filed 2012·Granted May 14, 2013·0 cites·18 claims
- 0950US6365302B1Pattern for measuring focus of light exposing apparatus and method thereofHYUNDAI ELECTRONICS IND·Filed 2000·Granted Apr 2, 2002·3 cites·20 claims
- 1048US2025116684A1Semiconductor package inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1147US8029949B2Photomask for forming contact hole in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Oct 4, 2011·0 cites·7 claims
- 1246US7932998B2Exposure apparatus having the same ID biasHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 26, 2011·0 cites·3 claims
- 1346US2009246963A1Exposure Apparatus Applying Polarization Illuminator and Exposure Method Using the SameHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 1446US2009110261A1Apparatus and Method for Verifying Pattern of Semiconductor DeviceHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 1545US7993814B2Method for forming patterns using single maskHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Aug 9, 2011·0 cites·10 claims
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