Inventor · disambiguated record
Chih-Chien Chang
Also filed as: CHANG CHIH-CHIEN
26 granted patents·7 pending applications·117 citations·filing 2004–2024
95Inventor score
Files withUNITED MICROELECTRONICS CORP15TAIWAN SEMICONDUCTOR MFG6REALTEK SEMICONDUCTOR CORP4PRIMAX ELECTRONICS LTD2TAIWAN SEMICONDUCTOR MFG CO LTD2
Top patents by PatentIndex Score
33 records- 0194US9583641B1Semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Feb 28, 2017·17 cites·11 claims
- 0292US10332884B2FinFET semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jun 25, 2019·13 cites·5 claims
- 0391US9740223B1RegulatorREALTEK SEMICONDUCTOR CORP·Filed 2016·Granted Aug 22, 2017·11 cites·16 claims
- 0491US7816217B2Multi-step epitaxial process for depositing Si/SiGeTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Oct 19, 2010·17 cites·21 claims
- 0589US9159791B2Semiconductor device comprising a conductive regionCHEN WEI-LIN·Filed 2012·Granted Oct 13, 2015·12 cites·7 claims
- 0688US10192874B2Nonvolatile memory cell and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 29, 2019·6 cites·15 claims
- 0785US9666680B1Flash cell and forming process thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 30, 2017·4 cites·19 claims
- 0881US7612389B2Embedded SiGe stressor with tensile strain for NMOS current enhancementTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Nov 3, 2009·9 cites·24 claims
- 0979US9760105B1RegulatorREALTEK SEMICONDUCTOR CORP·Filed 2016·Granted Sep 12, 2017·3 cites·20 claims
- 1075US8987813B2High voltage metal-oxide-semiconductor transistor deviceLEE CHIU-TE·Filed 2012·Granted Mar 24, 2015·4 cites·20 claims
- 1168US11990546B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Granted May 21, 2024·0 cites·20 claims
- 1265US7634183B2Focus adjustable method of optical imagePRIMAX ELECTRONICS LTD·Filed 2005·Granted Dec 15, 2009·3 cites·10 claims
- 1363US10020385B2Memory cell and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jul 10, 2018·1 cites·7 claims
- 1462US7732289B2Method of forming a MOS device with an additional layerTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Jun 8, 2010·2 cites·4 claims
- 1561US11631766B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2021·Granted Apr 18, 2023·0 cites·19 claims
- 1659US2025267892A1Semiconductor device and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1755US7142938B2Manufacturing management system and methodTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Nov 28, 2006·9 cites·14 claims
- 1854US12249647B2Power device and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Mar 11, 2025·0 cites·17 claims
- 1954US7129184B2Method of depositing an epitaxial layer of SiGe subsequent to a plasma etchTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 31, 2006·4 cites·20 claims
- 2054US2024321973A1Power metal-oxide-semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 2148US7587293B2Semiconductor CP (circuit probe) test management system and methodTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Sep 8, 2009·2 cites·18 claims
- 2247US10651183B1Manufacturing method of semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted May 12, 2020·0 cites·16 claims
- 2346US9536814B2Die stacking apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jan 3, 2017·0 cites·20 claims
- 2445US2024426461A1Complementary mold frame for blue light leakageDELL PRODUCTS LP·Filed 2023·Application pending·0 cites
- 2543US10083950B2Die stacking methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Sep 25, 2018·0 cites·20 claims
- 2641US11146281B2Multi-stage switched capacitor circuit and operation method thereofREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted Oct 12, 2021·0 cites·15 claims
- 2741US2016172200A1Method for fabricating non-volatile memory deviceUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 2840US9224857B2Semiconductor structure and method for manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2012·Granted Dec 29, 2015·0 cites·18 claims
- 2939US2006044266A1Motion testing method and system for testing optical sensing modulesPRIMAX ELECTRONICS LTD·Filed 2005·Application pending·0 cites
- 3038US2006228850A1Pattern loading effect reduction for selective epitaxial growthTSAI PANG-YEN·Filed 2005·Application pending·0 cites
- 3135US10141194B1Manufacturing method of semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted Nov 27, 2018·0 cites·11 claims
- 3235US10067521B2Low dropout regulator with PMOS power transistorREALTEK SEMICONDUCTOR CORP·Filed 2016·Granted Sep 4, 2018·0 cites·7 claims
- 3332US2016163722A1Non-volatile memory cell and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →