Inventor · disambiguated record
Huicai Zhong
Also filed as: ZHONG HUICAI
85 granted patents·23 pending applications·929 citations·filing 2002–2020
99Inventor score
Files withZHONG HUICAI29LIANG QINGQING24ADVANCED MICRO DEVICES INC17INST OF MICROELECTRONICS CAS14ZHU HUILONG7
Top patents by PatentIndex Score
108 records- 0198US7071051B1Method for forming a thin, high quality buffer layer in a field effect transistor and related structureADVANCED MICRO DEVICES INC·Filed 2004·Granted Jul 4, 2006·550 cites·10 claims
- 0295US7288451B2Method and structure for forming self-aligned, dual stress liner for CMOS devicesIBM·Filed 2005·Granted Oct 30, 2007·32 cites·13 claims
- 0390US7244644B2Undercut and residual spacer prevention for dual stressed layersADVANCED MICRO DEVICES INC·Filed 2005·Granted Jul 17, 2007·19 cites·20 claims
- 0490US7169676B1Semiconductor devices and methods for forming the same including contacting gate to sourceADVANCED MICRO DEVICES INC·Filed 2005·Granted Jan 30, 2007·19 cites·15 claims
- 0589US9070719B2Semiconductor device structure, method for manufacturing the same, and method for manufacturing FinZHONG HUICAI·Filed 2011·Granted Jun 30, 2015·11 cites·13 claims
- 0689US8592911B2Asymmetric semiconductor device having a high-k/metal gate and method of manufacturing the sameLIANG QINGQING·Filed 2010·Granted Nov 26, 2013·11 cites·9 claims
- 0788US8492206B2Semiconductor device structure and method for manufacturing the sameZHONG HUICAI·Filed 2011·Granted Jul 23, 2013·10 cites·17 claims
- 0888US6797572B1Method for forming a field effect transistor having a high-k gate dielectric and related structureADVANCED MICRO DEVICES INC·Filed 2003·Granted Sep 28, 2004·36 cites·7 claims
- 0984US9425288B2Method of manufacturing semiconductor deviceZHONG HUICAI·Filed 2012·Granted Aug 23, 2016·6 cites·15 claims
- 1084US8513742B2Method for manufacturing contact and semiconductor device having said contactZHONG HUICAI·Filed 2011·Granted Aug 20, 2013·7 cites·7 claims
- 1184US6872613B1Method for integrating metals having different work functions to form CMOS gates having a high-k gate dielectric and related structureADVANCED MICRO DEVICES INC·Filed 2003·Granted Mar 29, 2005·28 cites·25 claims
- 1281US7569892B2Method and structure for forming self-aligned, dual stress liner for CMOS devicesIBM·Filed 2007·Granted Aug 4, 2009·7 cites·6 claims
- 1380US9543188B2Isolation structure, method for manufacturing the same, and semiconductor device having the structureLUO ZHIJIONG·Filed 2011·Granted Jan 10, 2017·5 cites·8 claims
- 1480US7176531B1CMOS gates formed by integrating metals having different work functions and having a high-k gate dielectricADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 13, 2007·22 cites·6 claims
- 1579US9013918B2Two-terminal memory cell and semiconductor memory device based on different states of stable currentLIANG QINGQING·Filed 2011·Granted Apr 21, 2015·6 cites·4 claims
- 1679US8987136B2Semiconductor device and method for manufacturing local interconnect structure thereofZHONG HUICAI·Filed 2011·Granted Mar 24, 2015·5 cites·12 claims
- 1779US8859378B2Fin field-effect transistor and method for manufacturing the sameLIANG QINGQING·Filed 2011·Granted Oct 14, 2014·5 cites·17 claims
- 1878US8610248B2Capacitor structure and method of manufactureLIANG QINGQING·Filed 2010·Granted Dec 17, 2013·5 cites·9 claims
- 1978US7745296B2Raised source and drain process with disposable spacersGLOBALFOUNDRIES INC·Filed 2005·Granted Jun 29, 2010·7 cites·13 claims
- 2077US9397007B2Method for manufacturing semiconductor structure through forming an additional layer inside opening of a photoresist layerINST OF MICROELECTRONICS CAS·Filed 2013·Granted Jul 19, 2016·3 cites·5 claims
- 2177US7456058B1Stressed MOS device and methods for its fabricationADVANCED MICRO DEVICES INC·Filed 2005·Granted Nov 25, 2008·6 cites·4 claims
- 2277US7157374B1Method for removing a cap from the gate of an embedded silicon germanium semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2004·Granted Jan 2, 2007·21 cites·17 claims
- 2376US8829621B2Semiconductor substrate for manufacturing transistors having back-gates thereonZHU HUILONG·Filed 2011·Granted Sep 9, 2014·4 cites·19 claims
- 2476US8652884B2Semiconductor device structure and method for manufacturing the sameZHONG HUICAI·Filed 2011·Granted Feb 18, 2014·4 cites·10 claims
- 2576US8481379B2Method for manufacturing fin field-effect transistorLIANG QINGQING·Filed 2011·Granted Jul 9, 2013·4 cites·17 claims
- 2675US9653358B2Semiconductor device structure and method for manufacturing the sameZHONG HUICAI·Filed 2011·Granted May 16, 2017·4 cites·17 claims
- 2775US9293377B2Semiconductor device structure and method for manufacturing the sameZHONG HUICAI·Filed 2011·Granted Mar 22, 2016·4 cites·8 claims
- 2875US8557677B2Stack-type semiconductor device and method for manufacturing the sameLIANG QINGQING·Filed 2011·Granted Oct 15, 2013·3 cites·4 claims
- 2973US9064954B2Semiconductor devices and methods for manufacturing the sameZHU HUILONG·Filed 2012·Granted Jun 23, 2015·3 cites·5 claims
- 3072US9379056B2Semiconductor structure and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2012·Granted Jun 28, 2016·2 cites·10 claims
- 3172US9024435B2Semiconductor device, formation method thereof, and package structureZHONG HUICAI·Filed 2011·Granted May 5, 2015·3 cites·5 claims
- 3272US8975700B2Semiconductor device having a trench isolation structureLIANG QINGQING·Filed 2011·Granted Mar 10, 2015·3 cites·9 claims
- 3372US8703558B2Graphene device and method for manufacturing the sameLIANG QINGQING·Filed 2011·Granted Apr 22, 2014·4 cites·4 claims
- 3472US8420492B2MOS transistor and method for forming the sameZHONG HUICAI·Filed 2011·Granted Apr 16, 2013·3 cites·23 claims
- 3571US8779514B2Transistor and method for manufacturing the sameLIANG QINGQING·Filed 2011·Granted Jul 15, 2014·3 cites·4 claims
- 3671US6873020B2High/low work function metal alloys for integrated circuit electrodesUNIV NORTH CAROLINA STATE·Filed 2002·Granted Mar 29, 2005·20 cites·12 claims
- 3770US10833086B2Semiconductor arrangement having continuous spacers and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2016·Granted Nov 10, 2020·1 cites·21 claims
- 3869US11251183B2Semiconductor arrangement having continuous spacers and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2020·Granted Feb 15, 2022·0 cites·21 claims
- 3968US11251184B2Semiconductor arrangement having continuous spacers and method of manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2020·Granted Feb 15, 2022·0 cites·25 claims
- 4067US8957481B2Semiconductor structure and method for manufacturing the sameZHU HUILONG·Filed 2011·Granted Feb 17, 2015·2 cites·26 claims
- 4166US8759923B2Semiconductor device structure and method for manufacturing the sameZHONG HUICAI·Filed 2011·Granted Jun 24, 2014·2 cites·7 claims
- 4266US8716095B2Manufacturing method of gate stack and semiconductor deviceZHONG HUICAI·Filed 2010·Granted May 6, 2014·2 cites·6 claims
- 4366US8492210B2Transistor, semiconductor device comprising the transistor and method for manufacturing the sameLIANG QINGQING·Filed 2011·Granted Jul 23, 2013·2 cites·26 claims
- 4466US8460988B2Method for manufacturing semiconductor deviceZHONG HUICAI·Filed 2010·Granted Jun 11, 2013·1 cites·9 claims
- 4565US8008213B2Self-assembly process for memory arraySANDISK 3D LLC·Filed 2008·Granted Aug 30, 2011·2 cites·7 claims
- 4664US6902977B1Method for forming polysilicon gate on high-k dielectric and related structureADVANCED MICRO DEVICES INC·Filed 2003·Granted Jun 7, 2005·10 cites·12 claims
- 4763US7022596B2Method for forming rectangular-shaped spacers for semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2003·Granted Apr 4, 2006·8 cites·11 claims
- 4862US8772127B2Semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Jul 8, 2014·1 cites·16 claims
- 4961US8748983B2Embedded source/drain MOS transistorZHONG HUICAI·Filed 2011·Granted Jun 10, 2014·1 cites·7 claims
- 5057US7485521B2Self-aligned dual stressed layers for NFET and PFETIBM·Filed 2005·Granted Feb 3, 2009·5 cites·19 claims
Showing the top 50 of 108 patent records by PatentIndex Score.
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