Inventor · disambiguated record
Mei-Mei Su
Also filed as: SU MEI-MEI
20 granted patents·3 pending applications·75 citations·filing 2007–2023
93Inventor score
Top patents by PatentIndex Score
23 records- 0196US10288681B2Test architecture with a small form factor test board for rapid prototypingADVANTEST CORP·Filed 2018·Granted May 14, 2019·11 cites·27 claims
- 0295US11009550B2Test architecture with an FPGA based test board to simulate a DUT or end-pointADVANTEST CORP·Filed 2018·Granted May 18, 2021·9 cites·20 claims
- 0392US10162007B2Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independentlyADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·13 cites·32 claims
- 0491US11002787B2Scalable platform for system level testingADVANTEST CORP·Filed 2018·Granted May 11, 2021·9 cites·32 claims
- 0590US11619667B2Enhanced loopback diagnostic systems and methodsADVANTEST CORP·Filed 2021·Granted Apr 4, 2023·2 cites·20 claims
- 0689US10241146B2Test system and methodADVANTEST CORP·Filed 2017·Granted Mar 26, 2019·4 cites·20 claims
- 0787US12055581B2Software directed firmware accelerationADVANTEST CORP·Filed 2020·Granted Aug 6, 2024·2 cites·16 claims
- 0887US10929260B2Traffic capture and debugging tools for identifying root causes of device failure during automated testingADVANTEST CORP·Filed 2018·Granted Feb 23, 2021·6 cites·18 claims
- 0986US12079098B2Automated test equipment with hardware acceleratorADVANTEST CORP·Filed 2020·Granted Sep 3, 2024·2 cites·11 claims
- 1086US9310427B2High speed tester communication interface between test slice and traysADVANTEST CORP·Filed 2013·Granted Apr 12, 2016·6 cites·20 claims
- 1183US11860229B2Device interface board supporting devices with multiple different standards to interface with the same socketADVANTEST CORP·Filed 2021·Granted Jan 2, 2024·1 cites·18 claims
- 1281US11099228B2Test system and methodADVANTEST CORP·Filed 2017·Granted Aug 24, 2021·2 cites·19 claims
- 1376US7865788B2Dynamic mask memory for serial scan testingVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 4, 2011·8 cites·7 claims
- 1468US12436186B2Self-reset testing systems and methodsADVANTEST CORP·Filed 2023·Granted Oct 7, 2025·0 cites·19 claims
- 1564US11041907B2Method and system for acquisition of test dataADVANTEST CORP·Filed 2019·Granted Jun 22, 2021·0 cites·17 claims
- 1661US12320851B2Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socketADVANTEST CORP·Filed 2021·Granted Jun 3, 2025·0 cites·20 claims
- 1760US11714132B2Test equipment diagnostics systems and methodsADVANTEST CORP·Filed 2021·Granted Aug 1, 2023·0 cites·19 claims
- 1857US9933454B2Universal test floor systemADVANTEST CORP·Filed 2014·Granted Apr 3, 2018·0 cites·20 claims
- 1957US2024118340A1Processor test pattern generation and application for tester systemsADVANTEST CORP·Filed 2023·Application pending·0 cites
- 2056US10634723B2Method and system for acquisition of test dataADVANTEST CORP·Filed 2018·Granted Apr 28, 2020·0 cites·18 claims
- 2151US12140609B2Universal test interface systems and methodsADVANTEST CORP·Filed 2021·Granted Nov 12, 2024·0 cites·20 claims
- 2251US2024094287A1Low power environment for high performance processor without low power modeADVANTEST CORP·Filed 2023·Application pending·0 cites
- 2340US2019278645A1Log post-processor for identifying root causes of device failure during automated testingADVANTEST CORP·Filed 2018·Application pending·0 cites
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