Inventor · disambiguated record
Michael Overdick
Also filed as: OVERDICK MICHAEL
26 granted patents·3 pending applications·248 citations·filing 2000–2020
96Inventor score
Files withKONINKL PHILIPS ELECTRONICS NV23HERRMANN CHRISTOPH2SICK AG2KAUFMANN JÜRGEN1RIBBING CAROLINA1
Top patents by PatentIndex Score
29 records- 0190US8827884B2Oncology therapies employing radioactive seedsRIBBING CAROLINA·Filed 2010·Granted Sep 9, 2014·10 cites·12 claims
- 0289US7601961B2X-ray image detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Oct 13, 2009·17 cites·29 claims
- 0384US8772726B2Apparatus and method for data acquisition using an imaging apparatusHERRMANN CHRISTOPH·Filed 2010·Granted Jul 8, 2014·7 cites·20 claims
- 0484US6760405B2Exposure control in an x-ray image detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Jul 6, 2004·29 cites·15 claims
- 0583US6759658B2X-ray detector having a large dynamic rangeKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jul 6, 2004·26 cites·9 claims
- 0682US6653636B2Sensor and method of operating the sensorKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Nov 25, 2003·24 cites·13 claims
- 0780US6586743B1X-ray detector having sensors and evaluation unitsKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Jul 1, 2003·23 cites·18 claims
- 0879US7582876B2Electronic device with an array of processing unitsKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Sep 1, 2009·6 cites·16 claims
- 0978US6854885B2Method for the correction of unequal conversion characteristics of image sensorsKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Feb 15, 2005·21 cites·17 claims
- 1077US7408166B2X-ray examination apparatus and radiation detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Aug 5, 2008·5 cites·19 claims
- 1175US7711090B2Production of X-ray images containing a reduced proportion of scattered radiationKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Granted May 4, 2010·9 cites·20 claims
- 1274US7346146B2X-ray detector with photo-gates and dose controlKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Mar 18, 2008·3 cites·10 claims
- 1374US6600159B2Image correction method for an X-ray detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Jul 29, 2003·13 cites·5 claims
- 1470US6894283B1Sensor matrixKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted May 17, 2005·10 cites·9 claims
- 1568US8288733B2Radiation sensitive detectorHERRMANN CHRISTOPH·Filed 2008·Granted Oct 16, 2012·5 cites·24 claims
- 1661US7161154B2Array of sensor elementsKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Jan 9, 2007·5 cites·17 claims
- 1759US6839407B2Arrangement of sensor elementsKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jan 4, 2005·8 cites·20 claims
- 1857US7381956B2Detector element for spatially resolved detection of gamma radiationKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Jun 3, 2008·6 cites·20 claims
- 1957US7339246B2Sensor arrangement consisting of light-sensitive and/or X-ray sensitive sensorsKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Mar 4, 2008·8 cites·15 claims
- 2055US6901134B2Arrangement comprising electrical elementsKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted May 31, 2005·2 cites·24 claims
- 2154US8749788B2Optoelectronic apparatus for gas analysis and methodKAUFMANN JÜRGEN·Filed 2011·Granted Jun 10, 2014·1 cites·10 claims
- 2254US7483515B2Detector for the detection of X-radiationKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Jan 27, 2009·2 cites·16 claims
- 2352US7301151B2Detector for the temporally resolved recording of detection eventsKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Nov 27, 2007·4 cites·21 claims
- 2449US7521683B2X-ray detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Apr 21, 2009·0 cites·23 claims
- 2549US7233004B2X-ray examination apparatus including a dosimeterKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Jun 19, 2007·4 cites·20 claims
- 2647US7408165B2Detector arrangementKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Aug 5, 2008·0 cites·16 claims
- 2744US2021129320A1Method for automatically handling objectsSICK AG·Filed 2020·Application pending·0 cites
- 2837US2008290280A1Scintillator for an X-Ray Detector with a Variable ReflectorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 2934US2016363481A1Spectrometer and analysis apparatusSICK AG·Filed 2016·Application pending·0 cites
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