Inventor · disambiguated record
Daria R. Dooling
Also filed as: DOOLING DARIA R · DOOLING DARIA ROSE
13 granted patents·361 citations·filing 1996–2008
92Inventor score
Files withIBM13
Top patents by PatentIndex Score
13 records- 0198US7434185B2Method and apparatus for parallel data preparation and processing of integrated circuit graphical design dataIBM·Filed 2006·Granted Oct 7, 2008·203 cites·10 claims
- 0281US6788302B1Partitioning and load balancing graphical shape data for parallel applicationsIBM·Filed 2000·Granted Sep 7, 2004·35 cites·53 claims
- 0375US7698709B2Method and apparatus to manage multi-computer supply based on an economic modelIBM·Filed 2007·Granted Apr 13, 2010·6 cites·14 claims
- 0472US7051307B2Autonomic graphical partitioningIBM·Filed 2003·Granted May 23, 2006·17 cites·29 claims
- 0568US7315305B2Method for visualizing dataIBM·Filed 1999·Granted Jan 1, 2008·60 cites·12 claims
- 0662US7389480B2Content based yield prediction of VLSI designsIBM·Filed 2005·Granted Jun 17, 2008·2 cites·6 claims
- 0760US7305674B2Method and apparatus to manage multi-computer supplyIBM·Filed 2001·Granted Dec 4, 2007·6 cites·17 claims
- 0859US7661081B2Content based yield prediction of VLSI designsIBM·Filed 2008·Granted Feb 9, 2010·1 cites·14 claims
- 0951US7653907B2Method and apparatus to manage multi-computer supply using a model based on an economic model of supply and cost of supplyIBM·Filed 2007·Granted Jan 26, 2010·0 cites·15 claims
- 1044US7136798B2Method and apparatus to manage multi-computer demandIBM·Filed 2002·Granted Nov 14, 2006·0 cites·24 claims
- 1143US6301690B1Method to improve integrated circuit defect limited yieldIBM·Filed 1999·Granted Oct 9, 2001·11 cites·14 claims
- 1236US6601025B1Method to partition the physical design of an integrated circuit for electrical simulationIBM·Filed 1999·Granted Jul 29, 2003·9 cites·29 claims
- 1334US5878424AMethod and apparatus for indexing patterned sparse arrays for microprocessor data cacheIBM·Filed 1996·Granted Mar 2, 1999·11 cites·21 claims
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