Inventor · disambiguated record
Saibal Mukhopadhyay
Also filed as: MUKHOPADHYAY SAIBAL
10 granted patents·3 pending applications·123 citations·filing 2005–2024
88Inventor score
Top patents by PatentIndex Score
13 records- 0193US7642864B2Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effectIBM·Filed 2008·Granted Jan 5, 2010·35 cites·20 claims
- 0293US7508697B1Self-repairing technique in nano-scale SRAM to reduce parametric failuresPURDUE RESEARCH FOUNDATION·Filed 2007·Granted Mar 24, 2009·48 cites·4 claims
- 0388US8682634B2Analyzing a patterning process using a model of yieldBAGHERI SAEED·Filed 2012·Granted Mar 25, 2014·5 cites·20 claims
- 0486US7304903B2Sense amplifier circuitPURDUE RESEARCH FOUNDATION·Filed 2006·Granted Dec 4, 2007·20 cites·28 claims
- 0574US8880382B2Analyzing a patterning process using a model of yieldBAGHERI SAEED·Filed 2012·Granted Nov 4, 2014·3 cites·18 claims
- 0672US8176444B2Analyzing multiple induced systematic and statistical layout dependent effects on circuit performanceBANERJEE SHAYAK·Filed 2009·Granted May 8, 2012·5 cites·18 claims
- 0768US8418087B2Analyzing multiple induced systematic and statistical layout dependent effects on circuit performanceBANERJEE SHAYAK·Filed 2012·Granted Apr 9, 2013·2 cites·10 claims
- 0863US2024281662A1System and Methods for Solving Constraint Optimization Problems using Machine LearningGEORGIA TECH RES INST·Filed 2024·Application pending·0 cites
- 0955US7319343B2Low power scan design and delay fault testing technique using first level supply gatingPURDUE RES FOUNDATION PURDUE U·Filed 2005·Granted Jan 15, 2008·4 cites·51 claims
- 1047US8086917B2Methods for characterizing device variation in electronic memory circuitsCHUANG CHING-TE K·Filed 2009·Granted Dec 27, 2011·1 cites·5 claims
- 1147US2011173577A1Techniques for Pattern Process Tuning and Design Optimization for Maximizing Process-Sensitive Circuit YieldsIBM·Filed 2008·Application pending·0 cites
- 1241US7673195B2Circuits and methods for characterizing device variation in electronic memory circuitsIBM·Filed 2007·Granted Mar 2, 2010·0 cites·16 claims
- 1336US2009190426A1Circuits, methods and design structures for adaptive repair of sram arraysIBM·Filed 2008·Application pending·0 cites
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