Inventor · disambiguated record
Chang-Tzu Wang
Also filed as: WANG CHANG-TZU
34 granted patents·4 pending applications·115 citations·filing 2007–2017
96Inventor score
Top patents by PatentIndex Score
38 records- 0192US8604548B2Semiconductor device having ESD deviceWANG CHANG-TZU·Filed 2011·Granted Dec 10, 2013·14 cites·10 claims
- 0292US7586721B2ESD detection circuitUNITED MICROELECTRONICS CORP·Filed 2007·Granted Sep 8, 2009·23 cites·7 claims
- 0387US8817434B2Electrostatic discharge (ESD) protection deviceWANG CHANG-TZU·Filed 2011·Granted Aug 26, 2014·10 cites·18 claims
- 0486US8467162B2ESD protection circuit and ESD protection device thereofWANG CHANG-TZU·Filed 2010·Granted Jun 18, 2013·8 cites·10 claims
- 0585US7582916B2Silicon controlled rectifierUNITED MICROELECTRONICS CORP·Filed 2008·Granted Sep 1, 2009·11 cites·16 claims
- 0681US9093565B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 28, 2015·3 cites·5 claims
- 0781US8981521B1Lateral bipolar junction transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 17, 2015·7 cites·10 claims
- 0881US7880195B2Electrostatic discharge protection device and related circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Feb 1, 2011·9 cites·19 claims
- 0979US9564436B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Feb 7, 2017·5 cites·21 claims
- 1078US8525265B2Electrostatic discharge protection circuitKER MING-DOU·Filed 2010·Granted Sep 3, 2013·3 cites·8 claims
- 1176US8981488B1Semiconductor structure and integrated circuitUNITED MICROELECTRONICS CORP·Filed 2013·Granted Mar 17, 2015·4 cites·19 claims
- 1276US7906810B2LDMOS device for ESD protection circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Mar 15, 2011·6 cites·16 claims
- 1373US8648421B2Electrostatic discharge (ESD) device and semiconductor structureWEN YUNG-JU·Filed 2011·Granted Feb 11, 2014·5 cites·14 claims
- 1469US9627210B2Method of fabricating electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2016·Granted Apr 18, 2017·1 cites·8 claims
- 1568US8379354B2ESD protection circuitry with multi-finger SCRSUNITED MICROELECTRONICS CORP·Filed 2008·Granted Feb 19, 2013·3 cites·20 claims
- 1666US8890250B2Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2012·Granted Nov 18, 2014·2 cites·14 claims
- 1759US9449960B2Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 20, 2016·1 cites·18 claims
- 1856US9559091B2Method of manufacturing fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jan 31, 2017·0 cites·5 claims
- 1956US9455246B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 27, 2016·0 cites·4 claims
- 2056US9331064B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 3, 2016·0 cites·4 claims
- 2155US9190840B2Electrostatic discharge protection circuitUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 17, 2015·0 cites·19 claims
- 2255US8748278B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 10, 2014·0 cites·6 claims
- 2352US9378958B2Electrostatic discharge protection structure and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2012·Granted Jun 28, 2016·0 cites·8 claims
- 2451US10236285B2Electrostatic discharge (ESD) protection deviceMEDIATEK INC·Filed 2017·Granted Mar 19, 2019·0 cites·19 claims
- 2550US8711535B2ESD protection circuit and ESD protection device thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 29, 2014·0 cites·13 claims
- 2649US8730628B2Electrostatic protection circuit capable of preventing latch-up effectWANG CHANG-TZU·Filed 2011·Granted May 20, 2014·0 cites·15 claims
- 2746US9666576B2Electrostatic discharge (ESD) protection deviceMEDIATEK INC·Filed 2015·Granted May 30, 2017·0 cites·14 claims
- 2846US9368500B2Complementary metal-oxide-semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 14, 2016·0 cites·16 claims
- 2945US2011026175A1Electrostatic discharge protecting circuit with ultra-low standby leakage current for twice supply voltage toleranceUNIV NAT SUN YAT SEN·Filed 2009·Application pending·0 cites
- 3044US8884337B2Output bufferUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 11, 2014·0 cites·10 claims
- 3144US2010102379A1Lateral diffused metal oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2008·Application pending·0 cites
- 3242US2015129977A1Semiconductor electrostatic discharge protection apparatusUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 3341US9947659B2Fin field-effect transistor gated diodeMEDIATEK INC·Filed 2015·Granted Apr 17, 2018·0 cites·20 claims
- 3441US8716801B2Metal oxide semiconductor deviceChen lu-an·Filed 2012·Granted May 6, 2014·0 cites·16 claims
- 3540US8963202B2Electrostatic discharge protection apparatusWANG CHANG-TZU·Filed 2012·Granted Feb 24, 2015·0 cites·19 claims
- 3638US8319258B2Electro-static discharge (ESD) clamping deviceWANG CHANG-TZU·Filed 2010·Granted Nov 27, 2012·0 cites·17 claims
- 3737US9437590B2Electrostatic discharge protection device and electrostatic discharge protection systemMEDIATEK INC·Filed 2015·Granted Sep 6, 2016·0 cites·20 claims
- 3837US2017221879A1Electrostatic discharge protection circuit with leakage current reduction and associated electrostatic discharge protection methodMEDIATEK INC·Filed 2016·Application pending·0 cites
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