Inventor · disambiguated record
William G. Manns
Also filed as: MANNS WILLIAM G
19 granted patents·698 citations·filing 1975–1995
96Inventor score
Files withTEXAS INSTRUMENTS INC19
Top patents by PatentIndex Score
19 records- 0193US5001764AGuardbands for pattern inspectorTEXAS INSTRUMENTS INC·Filed 1988·Granted Mar 19, 1991·87 cites·3 claims
- 0291US5095447AColor overlay of scanned and reference images for displayTEXAS INSTRUMENTS INC·Filed 1990·Granted Mar 10, 1992·121 cites·8 claims
- 0389US5018210APattern comparator with substage illumination and polygonal data representationTEXAS INSTRUMENTS INC·Filed 1988·Granted May 21, 1991·100 cites·6 claims
- 0489US4912487ALaser scanner using focusing acousto-optic deviceTEXAS INSTRUMENTS INC·Filed 1988·Granted Mar 27, 1990·72 cites·8 claims
- 0580US5027132APosition compensation of laser scan for stage movementTEXAS INSTRUMENTS INC·Filed 1989·Granted Jun 25, 1991·39 cites·8 claims
- 0676US4385202AElectronic circuit interconnection systemTEXAS INSTRUMENTS INC·Filed 1980·Granted May 24, 1983·40 cites·9 claims
- 0771US4979223AData handling system for pattern inspector or writerTEXAS INSTRUMENTS INC·Filed 1988·Granted Dec 18, 1990·43 cites·4 claims
- 0869US4989255AExpansion of compact database for pattern inspector or writerTEXAS INSTRUMENTS INC·Filed 1988·Granted Jan 29, 1991·21 cites·6 claims
- 0969US4472762AElectronic circuit interconnection systemTEXAS INSTRUMENTS INC·Filed 1982·Granted Sep 18, 1984·30 cites·27 claims
- 1067US4160310AMetal-dielectric electron beam scanning stackTEXAS INSTRUMENTS INC·Filed 1976·Granted Jul 10, 1979·11 cites·8 claims
- 1160US5018212ADefect area consolidation for pattern inspectorTEXAS INSTRUMENTS INC·Filed 1988·Granted May 21, 1991·29 cites·5 claims
- 1256US4008950AElectrochromic display cell structureTEXAS INSTRUMENTS INC·Filed 1975·Granted Feb 22, 1977·13 cites·12 claims
- 1355US4984282AParallel processing of reference and guardband dataTEXAS INSTRUMENTS INC·Filed 1988·Granted Jan 8, 1991·12 cites·5 claims
- 1455US4546406AElectronic circuit interconnection systemTEXAS INSTRUMENTS INC·Filed 1984·Granted Oct 8, 1985·18 cites·1 claims
- 1553US5592211ALaser pattern/inspector with a linearly ramped chirp deflectorTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 7, 1997·19 cites·10 claims
- 1651US4969200ATarget autoalignment for pattern inspector or writerTEXAS INSTRUMENTS INC·Filed 1988·Granted Nov 6, 1990·20 cites·6 claims
- 1741US5046110AComparator error filtering for pattern inspectorTEXAS INSTRUMENTS INC·Filed 1988·Granted Sep 3, 1991·16 cites·3 claims
- 1839US4135281AMetal-dielectric electron beam scanning stackTEXAS INSTRUMENTS INC·Filed 1976·Granted Jan 23, 1979·3 cites·7 claims
- 1933US4991977ASmoothing filter for stage position pulsesTEXAS INSTRUMENTS INC·Filed 1988·Granted Feb 12, 1991·4 cites·5 claims
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