Inventor · disambiguated record
Tomonori Honda
Also filed as: HONDA TOMONORI
15 granted patents·3 pending applications·32 citations·filing 1992–2024
88Inventor score
Top patents by PatentIndex Score
18 records- 0197US11295993B2Maintenance scheduling for semiconductor manufacturing equipmentPDF SOLUTIONS INC·Filed 2020·Granted Apr 5, 2022·6 cites·20 claims
- 0292US11029673B2Generating robust machine learning predictions for semiconductor manufacturing processesPDF SOLUTIONS INC·Filed 2018·Granted Jun 8, 2021·9 cites·17 claims
- 0385US11029359B2Failure detection and classsification using sensor data and/or measurement dataPDF SOLUTIONS INC·Filed 2019·Granted Jun 8, 2021·8 cites·19 claims
- 0483US2025138505A1Sequenced Approach for Determining Wafer Path QualityPDF SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 0579US10078062B2Device health estimation by combining contextual information with sensor dataPALO ALTO RES CT INC·Filed 2015·Granted Sep 18, 2018·2 cites·20 claims
- 0677US12223012B2Machine learning variable selection and root cause discovery by cumulative predictionPDF SOLUTIONS INC·Filed 2020·Granted Feb 11, 2025·1 cites·6 claims
- 0774US12229945B2Wafer bin map based root cause analysisPDF SOLUTIONS INC·Filed 2023·Granted Feb 18, 2025·0 cites·19 claims
- 0872US10777470B2Selective inclusion/exclusion of semiconductor chips in accelerated failure testsPDF SOLUTIONS INC·Filed 2019·Granted Sep 15, 2020·1 cites·7 claims
- 0971US10558766B2Method for Modelica-based system fault analysis at the design stagePALO ALTO RES CT INC·Filed 2016·Granted Feb 11, 2020·1 cites·14 claims
- 1070US2022066410A1Sequenced Approach For Determining Wafer Path QualityPDF SOLUTIONS INC·Filed 2021·Application pending·0 cites
- 1165US11763446B2Wafer bin map based root cause analysisPDF SOLUTIONS INC·Filed 2021·Granted Sep 19, 2023·0 cites·20 claims
- 1261US2024184283A1Time-Series Segmentation and Anomaly DetectionPDF SOLUTIONS INC·Filed 2023·Application pending·0 cites
- 1357US11972552B2Abnormal wafer image classificationPDF SOLUTIONS INC·Filed 2021·Granted Apr 30, 2024·0 cites·20 claims
- 1453US11775714B2Rational decision-making tool for semiconductor processesPDF SOLUTIONS INC·Filed 2021·Granted Oct 3, 2023·0 cites·27 claims
- 1551US11609812B2Anomalous equipment trace detection and classificationPDF SOLUTIONS INC·Filed 2020·Granted Mar 21, 2023·0 cites·9 claims
- 1647US11022642B2Semiconductor yield predictionPDF SOLUTIONS INC·Filed 2018·Granted Jun 1, 2021·0 cites·18 claims
- 1746US12038802B2Collaborative learning model for semiconductor applicationsPDF SOLUTIONS INC·Filed 2020·Granted Jul 16, 2024·0 cites·13 claims
- 1822US5368665AMethod of jointing porous building platesINAX CORP·Filed 1992·Granted Nov 29, 1994·4 cites·4 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →