Inventor · disambiguated record
Eiko Nakazawa
Also filed as: NAKAZAWA EIKO
20 granted patents·2 pending applications·28 citations·filing 2002–2019
91Inventor score
Files withHITACHI HIGH TECH CORP13FUJISAWA AKIKO3NAKAZAWA EIKO3HITACHI LTD1HITACHI SCIENCE SYSTEMS LTD1
Top patents by PatentIndex Score
22 records- 0184US8785883B2Transmission electron microscope, and method of observing specimenNAKAZAWA EIKO·Filed 2009·Granted Jul 22, 2014·9 cites·16 claims
- 0270US9013572B2Method for observing sample and electronic microscopeFUJISAWA AKIKO·Filed 2009·Granted Apr 21, 2015·2 cites·13 claims
- 0370US6875983B2Electron microscope and means to set observation conditionsHITACHI LTD·Filed 2002·Granted Apr 5, 2005·7 cites·4 claims
- 0469US7838829B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 23, 2010·2 cites·7 claims
- 0567US8212224B2Charged particle beam deviceFUJISAWA AKIKO·Filed 2009·Granted Jul 3, 2012·2 cites·7 claims
- 0663US7214938B2Sample observation method and transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted May 8, 2007·4 cites·6 claims
- 0760US9129772B2Transmission electron microscope, and method of observing specimenHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 8, 2015·0 cites·21 claims
- 0860US8164058B2Specimen observation methodNAKAZAWA EIKO·Filed 2009·Granted Apr 24, 2012·0 cites·6 claims
- 0959US10808312B2Charged particle device and wiring methodHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 20, 2020·0 cites·14 claims
- 1058US7573030B2Specimen observation methodHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 11, 2009·0 cites·3 claims
- 1157US8410440B2Specimen observation methodNAKAZAWA EIKO·Filed 2012·Granted Apr 2, 2013·0 cites·2 claims
- 1254US11221280B2Method of preparing biological tissue sample and method of observing biological tissue section sampleHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 11, 2022·0 cites·13 claims
- 1354US9963776B2Charged particle device and wiring methodHITACHI HIGH TECH CORP·Filed 2013·Granted May 8, 2018·0 cites·8 claims
- 1454US7705305B2Sample observation method and transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 27, 2010·0 cites·12 claims
- 1553US7041977B2Electron microscopeHITACHI SCIENCE SYSTEMS LTD·Filed 2005·Granted May 9, 2006·0 cites·5 claims
- 1652US10852253B2Specimen observation methodHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 1, 2020·0 cites·12 claims
- 1751US8288725B2Charged particle beam deviceFUJISAWA AKIKO·Filed 2010·Granted Oct 16, 2012·0 cites·5 claims
- 1849US2015185455A1Method for observing sample and electronic microscopeHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
- 1948US9202668B2Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimenHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 1, 2015·0 cites·17 claims
- 2045US6982420B2Sample observation method and transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 3, 2006·2 cites·10 claims
- 2142US2024077712A1Microscope Slide and Method for Selecting the SameHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 2236US8546770B2Charged particle beam device and sample observation methodMORIKAWA AKINARI·Filed 2010·Granted Oct 1, 2013·0 cites·20 claims
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