Inventor · disambiguated record
Jeffrey H. Dreibelbis
Also filed as: DREIBELBIS JEFFREY H · DREIBELBIS JEFFREY HARRIS
25 granted patents·1,166 citations·filing 1986–2008
97Inventor score
Top patents by PatentIndex Score
25 records- 0196US5961653AProcessor based BIST for an embedded memoryIBM·Filed 1997·Granted Oct 5, 1999·235 cites·49 claims
- 0295US7984329B2System and method for providing DRAM device-level repair via address remappings external to the deviceIBM·Filed 2007·Granted Jul 19, 2011·41 cites·22 claims
- 0395US6233184B1Structures for wafer level test and burn-inIBM·Filed 1998·Granted May 15, 2001·102 cites·44 claims
- 0495US5173906ABuilt-in self test for integrated circuitsDREIBELBIS JEFFREY H·Filed 1990·Granted Dec 22, 1992·234 cites·16 claims
- 0594US5875470AMulti-port multiple-simultaneous-access DRAM chipIBM·Filed 1997·Granted Feb 23, 1999·140 cites·11 claims
- 0693US6337595B1Low-power DC voltage generator systemIBM·Filed 2000·Granted Jan 8, 2002·52 cites·31 claims
- 0792US6426904B2Structures for wafer level test and burn-inIBM·Filed 2001·Granted Jul 30, 2002·43 cites·30 claims
- 0891US6507237B2Low-power DC voltage generator systemIBM·Filed 2002·Granted Jan 14, 2003·44 cites·26 claims
- 0983US6185709B1Device for indicating the fixability of a logic circuitIBM·Filed 1998·Granted Feb 6, 2001·56 cites·13 claims
- 1081US4709162AOff-chip driver circuitsIBM·Filed 1986·Granted Nov 24, 1987·27 cites·17 claims
- 1178US6452848B1Programmable built-in self test (BIST) data generator for semiconductor memory devicesIBM·Filed 2001·Granted Sep 17, 2002·29 cites·19 claims
- 1277US6577548B1Self timing interlock circuit for embedded DRAMIBM·Filed 2002·Granted Jun 10, 2003·25 cites·20 claims
- 1376US4730122APower supply adapter systemsIBM·Filed 1986·Granted Mar 8, 1988·34 cites·25 claims
- 1471US5019772ATest selection techniquesIBM·Filed 1989·Granted May 28, 1991·26 cites·25 claims
- 1569US7073100B2Method for testing embedded DRAM arraysIBM·Filed 2002·Granted Jul 4, 2006·16 cites·10 claims
- 1668US7737766B2Two stage voltage boost circuit, IC and design structureIBM·Filed 2008·Granted Jun 15, 2010·8 cites·20 claims
- 1765US6766468B2Memory BIST and repairIBM·Filed 2001·Granted Jul 20, 2004·14 cites·6 claims
- 1858US7472325B2Method for segmenting BIST functionality in an embedded memory array into remote lower-speed executable instructions and local higher-speed executable instructionsIBM·Filed 2008·Granted Dec 30, 2008·1 cites·13 claims
- 1958US7237165B2Method for testing embedded DRAM arraysIBM·Filed 2004·Granted Jun 26, 2007·9 cites·18 claims
- 2053US5463335APower up detection circuitsIBM·Filed 1992·Granted Oct 31, 1995·11 cites·20 claims
- 2147US6044024AInteractive method for self-adjusted access on embedded DRAM memory macrosIBM·Filed 1998·Granted Mar 28, 2000·10 cites·20 claims
- 2246US7710195B2Two stage voltage boost circuit with precharge circuit preventing leakage, IC and design structureIBM·Filed 2008·Granted May 4, 2010·1 cites·20 claims
- 2341US7733161B2Voltage boost system, IC and design structureIBM·Filed 2008·Granted Jun 8, 2010·0 cites·19 claims
- 2441US5682116AOff chip driver having slew rate control and differential voltage protection circuitryIBM·Filed 1995·Granted Oct 28, 1997·6 cites·19 claims
- 2539US7401281B2Remote BIST high speed test and redundancy calculationIBM·Filed 2004·Granted Jul 15, 2008·2 cites·20 claims
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