Inventor · disambiguated record
Reidar Lindstedt
Also filed as: LINDSTEDT REIDAR
12 granted patents·1 pending application·118 citations·filing 2003–2006
90Inventor score
Files withINFINEON TECHNOLOGIES AG12
Top patents by PatentIndex Score
13 records- 0188US7313044B2Integrated semiconductor memory with temperature-dependent voltage generationINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 25, 2007·24 cites·23 claims
- 0283US7379713B2Method for wireless data interchange between circuit units within a package, and circuit arrangement for performing the methodINFINEON TECHNOLOGIES AG·Filed 2004·Granted May 27, 2008·41 cites·18 claims
- 0378US7330387B2Integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·13 cites·10 claims
- 0465US6882556B2Semiconductor memory having a configuration of memory cellsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Apr 19, 2005·12 cites·11 claims
- 0555US6950358B2Circuit arrangement for setting a voltage supply for a test mode of an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 27, 2005·9 cites·12 claims
- 0654US6917563B2Integrated memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 12, 2005·8 cites·6 claims
- 0749US7057224B2Semiconductor memory having an arrangement of memory cellsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 6, 2006·4 cites·29 claims
- 0849US6936500B2Method for the lateral contacting of a semiconductor chipINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 30, 2005·4 cites·17 claims
- 0944US7349283B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2006·Granted Mar 25, 2008·1 cites·16 claims
- 1041US7136295B2Semiconductor arrangementINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 14, 2006·0 cites·26 claims
- 1138US6963514B2Method for testing an integrated semiconductor memory, and integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 8, 2005·2 cites·16 claims
- 1236US2004217452A1Semiconductor chip arrangement and a method for its productionFiled 2004·Application pending·0 cites
- 1334US7197679B2Method for testing an integrated semiconductor memory with a shortened reading timeINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 27, 2007·0 cites·13 claims
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