Inventor · disambiguated record
Won-Hyung Song
Also filed as: SONG WON · SONG WON-HYUNG
28 granted patents·2 pending applications·69 citations·filing 2004–2023
95Inventor score
Top patents by PatentIndex Score
30 records- 0197US10268541B2DRAM assist error correction mechanism for DDR SDRAM interfaceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Apr 23, 2019·18 cites·11 claims
- 0293US11625296B2DRAM assist error correction mechanism for DDR SDRAM interfaceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 11, 2023·2 cites·11 claims
- 0392US10977118B2DRAM assist error correction mechanism for DDR SDRAM interfaceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Apr 13, 2021·5 cites·6 claims
- 0488US10394648B2Method to deliver in-DRAM ECC information through DDR busSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 27, 2019·4 cites·10 claims
- 0583US9449650B2Memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 20, 2016·8 cites·18 claims
- 0682US10013341B2Semiconductor memory device having rank interleaving operation in memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 3, 2018·6 cites·16 claims
- 0781US12020742B2Compensating for concentrated activation of memory cells in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 25, 2024·1 cites·18 claims
- 0878US12242344B2DRAM assist error correction mechanism for DDR SDRAM interfaceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Mar 4, 2025·0 cites·11 claims
- 0977US11010242B2DRAM assist error correction mechanism for DDR SDRAM interfaceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 18, 2021·2 cites·3 claims
- 1077US10795764B2Method to deliver in-DRAM ECC information through DDR busSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 6, 2020·1 cites·12 claims
- 1176US10908993B2Method to deliver in-DRAM ECC information through DDR busSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 2, 2021·1 cites·21 claims
- 1275US9786354B2Memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 10, 2017·4 cites·18 claims
- 1375US9070572B2Memory module and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jun 30, 2015·3 cites·13 claims
- 1468US10417162B2Memory package including buffer, expansion memory module, and multi-module memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 17, 2019·1 cites·20 claims
- 1568US8441876B2Memory module including parallel test apparatusSONG WON-HYUNG·Filed 2011·Granted May 14, 2013·4 cites·16 claims
- 1667US9601163B2Memory module and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Mar 21, 2017·1 cites·20 claims
- 1764US9891856B2Memory address remapping system, device and method of performing address remapping operationSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 13, 2018·1 cites·20 claims
- 1864US9361948B2Memory module and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 7, 2016·1 cites·6 claims
- 1960US10504568B2Integrated circuit memory devices with customizable standard cell logicSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 10, 2019·0 cites·10 claims
- 2059US10997108B2Memory package including buffer, expansion memory module, and multi-module memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 4, 2021·0 cites·20 claims
- 2156US10162771B2Integrated circuit memory devices with customizable standard cell logicSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 25, 2018·0 cites·19 claims
- 2254US7273772B2Method for manufacturing thin film transistor array panelSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 25, 2007·6 cites·11 claims
- 2348US11848043B2Memory device and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 19, 2023·0 cites·20 claims
- 2445US9035670B2Semiconductor module, test system and method employing the sameSONG WON-HYUNG·Filed 2012·Granted May 19, 2015·0 cites·14 claims
- 2541US2008090343A1Method for manufacturing thin film transistor array panelSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 2640US10224960B2Memory device with error check function of memory cell array and memory module including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 5, 2019·0 cites·14 claims
- 2739US8341477B2Test board having a plurality of test modules and a test system having the sameSONG WON-HYUNG·Filed 2010·Granted Dec 25, 2012·0 cites·20 claims
- 2837US9099166B2Memory module and memory system comprising sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 4, 2015·0 cites·20 claims
- 2932US8232199B2Method of fabricating semiconductor device comprises a photoresist pattern having a desired critical dimensionSONG WON·Filed 2010·Granted Jul 31, 2012·0 cites·5 claims
- 3032US2012250434A1Method of accelerating write timing calibration and write timing calibration acceleration circuit in semiconductor memory deviceSONG WON-HYUNG·Filed 2012·Application pending·0 cites
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