Inventor · disambiguated record
Tetsuji Onuki
Also filed as: ONUKI TETSUJI
6 granted patents·344 citations·filing 1992–1998
88Inventor score
Files withNIKON CORP6
Top patents by PatentIndex Score
6 records- 0186US5929438ACantilever and measuring apparatus using itNIKON CORP·Filed 1997·Granted Jul 27, 1999·127 cites·31 claims
- 0283US5656769AScanning probe microscopeNIKON CORP·Filed 1995·Granted Aug 12, 1997·71 cites·39 claims
- 0380US5360977ACompound type microscopeNIKON CORP·Filed 1992·Granted Nov 1, 1994·52 cites·35 claims
- 0473US5508517AScanning probe type microscope apparatusNIKON CORP·Filed 1995·Granted Apr 16, 1996·46 cites·13 claims
- 0563US5317153AScanning probe microscopeNIKON CORP·Filed 1992·Granted May 31, 1994·25 cites·15 claims
- 0662US5986760AShape measurement method and high-precision lens manufacturing processNIKON CORP·Filed 1998·Granted Nov 16, 1999·23 cites·11 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →