Inventor · disambiguated record
Kevin George Harding
Also filed as: HARDING KEVIN · HARDING KEVIN G · HARDING KEVIN GEORGE
93 granted patents·19 pending applications·1,372 citations·filing 1982–2024
99Inventor score
Files withGEN ELECTRIC69IND TECHNOLOGY INST8ABRAMOVICH GIL4HARDING KEVIN GEORGE3BENDALL CLARK ALEXANDER2
Top patents by PatentIndex Score
112 records- 0196US8743196B2System and method for performing an external inspection on a wind turbine rotor bladeFRITZ PETER JAMES·Filed 2010·Granted Jun 3, 2014·24 cites·20 claims
- 0295US9025067B2Apparatus and method for image super-resolution using integral shifting opticsGEN ELECTRIC·Filed 2013·Granted May 5, 2015·20 cites·22 claims
- 0395US7821649B2Fringe projection system and method for a probe suitable for phase-shift analysisGE INSPECTION TECHNOLOGIES LP·Filed 2008·Granted Oct 26, 2010·44 cites·19 claims
- 0495US6701615B2Inspection and sorting system and method for part repairGEN ELECTRIC·Filed 2002·Granted Mar 9, 2004·77 cites·56 claims
- 0594US10814427B2Systems and methods for additive manufacturing in-build assessment and correction of laser pointing accuracyGEN ELECTRIC·Filed 2018·Granted Oct 27, 2020·5 cites·18 claims
- 0694US9207154B2Method and system for creep measurementGEN ELECTRIC·Filed 2013·Granted Dec 8, 2015·24 cites·16 claims
- 0794US4983043AHigh accuracy structured light profilerIND TECHNOLOGY INST·Filed 1988·Granted Jan 8, 1991·83 cites·11 claims
- 0893US9970753B2System and method of measuring geometric characteristics of objectGEN ELECTRIC·Filed 2015·Granted May 15, 2018·11 cites·20 claims
- 0993US9760986B2Method and system for automated shaped cooling hole measurementGEN ELECTRIC·Filed 2015·Granted Sep 12, 2017·26 cites·25 claims
- 1092US6084712AThree dimensional imaging using a refractive optic designDYNAMIC MEASUREMENT AND INSPEC·Filed 1998·Granted Jul 4, 2000·112 cites·20 claims
- 1191US8976363B2System aspects for a probe system that utilizes structured-lightBENDALL CLARK ALEXANDER·Filed 2011·Granted Mar 10, 2015·13 cites·38 claims
- 1291US8340456B1System and method for depth from defocus imagingDANESHPANAH MOHAMMAD MEHDI·Filed 2011·Granted Dec 25, 2012·28 cites·24 claims
- 1391US8107083B2System aspects for a probe system that utilizes structured-lightBENDALL CLARK ALEXANDER·Filed 2008·Granted Jan 31, 2012·22 cites·38 claims
- 1490US10399179B2Additive manufacturing systems and methodsGEN ELECTRIC·Filed 2016·Granted Sep 3, 2019·3 cites·16 claims
- 1590US8737756B2System and method for depth from defocus imagingGEN ELECTRIC·Filed 2012·Granted May 27, 2014·10 cites·17 claims
- 1690US7812968B2Fringe projection system and method for a probe using a coherent fiber bundleGE INSPECTION TECHNOLOGIES LP·Filed 2008·Granted Oct 12, 2010·24 cites·20 claims
- 1789US10583530B2System and methods for fabricating a component with laser arrayGEN ELECTRIC·Filed 2017·Granted Mar 10, 2020·3 cites·15 claims
- 1889US10500832B2Systems and methods for additive manufacturing rotating build platformsGEN ELECTRIC·Filed 2017·Granted Dec 10, 2019·3 cites·17 claims
- 1989US5307152AMoire inspection systemIND TECHNOLOGY INST·Filed 1992·Granted Apr 26, 1994·112 cites·24 claims
- 2088US4880991ANon-contact dimensional gage for turned partsIND TECHNOLOGY INST·Filed 1989·Granted Nov 14, 1989·56 cites·27 claims
- 2187US9338363B1Method and system for magnification correction from multiple focus planesGEN ELECTRIC·Filed 2014·Granted May 10, 2016·9 cites·20 claims
- 2287US8971588B2Apparatus and method for contactless high resolution handprint captureABRAMOVICH GIL·Filed 2011·Granted Mar 3, 2015·9 cites·29 claims
- 2387US4875777AOff-axis high accuracy structured light profilerIND TECHNOLOGY INST·Filed 1987·Granted Oct 24, 1989·47 cites·12 claims
- 2486US8600123B2System and method for contactless multi-fingerprint collectionABRAMOVICH GIL·Filed 2010·Granted Dec 3, 2013·17 cites·26 claims
- 2586US7489408B2Optical edge break gageGEN ELECTRIC·Filed 2005·Granted Feb 10, 2009·22 cites·6 claims
- 2686US5835218AMoire interferometry system and method with extended imaging depthINSUTRIAL TECHNOLOGY INST·Filed 1997·Granted Nov 10, 1998·73 cites·19 claims
- 2785US6678057B2Method and device for reduction in noise in images from shiny partsGEN ELECTRIC·Filed 2001·Granted Jan 13, 2004·26 cites·10 claims
- 2884US7898651B2Methods and apparatus for inspecting an objectGEN ELECTRIC·Filed 2005·Granted Mar 1, 2011·19 cites·13 claims
- 2983US8406487B2Method and system for contactless fingerprint detection and verificationABRAMOVICH GIL·Filed 2010·Granted Mar 26, 2013·9 cites·24 claims
- 3083US6874932B2Methods for determining the depth of defectsGEN ELECTRIC·Filed 2003·Granted Apr 5, 2005·24 cites·20 claims
- 3183US5367378AHighlighted panel inspectionIND TECHNOLOGY INST·Filed 1993·Granted Nov 22, 1994·60 cites·2 claims
- 3283US4478481AProduction of diffraction limited holographic imagesUNIV DAYTON·Filed 1982·Granted Oct 23, 1984·38 cites·9 claims
- 3382US10674101B2Imaging devices for use with additive manufacturing systems and methods of imaging a build layerGEN ELECTRIC·Filed 2017·Granted Jun 2, 2020·1 cites·14 claims
- 3481US10773336B2Imaging devices for use with additive manufacturing systems and methods of monitoring and inspecting additive manufacturing componentsGEN ELECTRIC·Filed 2018·Granted Sep 15, 2020·1 cites·23 claims
- 3579US8643849B2Measurement systems and methodsTAO LI·Filed 2011·Granted Feb 4, 2014·11 cites·18 claims
- 3679US5933231AMethod and system for measuring cavities and probe for use thereinIND TECHNOLOGY INST·Filed 1996·Granted Aug 3, 1999·48 cites·12 claims
- 3777US10906132B2Scan strategies for efficient utilization of laser arrays in direct metal laser melting (DMLM)GEN ELECTRIC·Filed 2017·Granted Feb 2, 2021·1 cites·20 claims
- 3877US9188543B2Inspection device and method thereofLI TAO·Filed 2012·Granted Nov 17, 2015·3 cites·16 claims
- 3977US7924439B2Method and system for parameter extraction of a cutting toolGEN ELECTRIC·Filed 2009·Granted Apr 12, 2011·10 cites·18 claims
- 4077US7499830B2Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined partGEN ELECTRIC·Filed 2005·Granted Mar 3, 2009·9 cites·19 claims
- 4177US7199386B2System and method for detecting defects in a light-management filmGEN ELECTRIC·Filed 2004·Granted Apr 3, 2007·12 cites·17 claims
- 4276US9148632B2Multi-resolution optical system and method of fabricating sameGEN ELECTRIC·Filed 2013·Granted Sep 29, 2015·2 cites·20 claims
- 4375US10724940B2System for monitoring and controlling equipment life due to corrosion degradationGEN ELECTRIC·Filed 2017·Granted Jul 28, 2020·1 cites·17 claims
- 4475US9874728B1Long working distance lens system, assembly, and methodGEN ELECTRIC·Filed 2016·Granted Jan 23, 2018·2 cites·12 claims
- 4575US9342728B2System and method for contactless multi-fingerprint collectionGEN ELECTRIC·Filed 2013·Granted May 17, 2016·3 cites·18 claims
- 4675US7577491B2System and method for extracting parameters of a cutting toolGEN ELECTRIC·Filed 2005·Granted Aug 18, 2009·6 cites·29 claims
- 4774US7912572B2Calibration assembly for an inspection systemGEN ELECTRIC·Filed 2007·Granted Mar 22, 2011·8 cites·25 claims
- 4874US5189493AMoire contouring cameraIND TECHNOLOGY INST·Filed 1991·Granted Feb 23, 1993·32 cites·20 claims
- 4971US10192298B2System and method for monitoring tape ends of a composite layup machineGEN ELECTRIC·Filed 2015·Granted Jan 29, 2019·1 cites·7 claims
- 5071US7876454B2Method and system for measurement of a cutting toolGEN ELECTRIC·Filed 2008·Granted Jan 25, 2011·7 cites·20 claims
Showing the top 50 of 112 patent records by PatentIndex Score.
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