Inventor · disambiguated record
Takahiro Manabe
Also filed as: MANABE TAKAHIRO
10 granted patents·2 pending applications·383 citations·filing 1988–2024
91Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD5TOSHIBA KK3MANABE TAKAHIRO2NISSAN MOTOR1PANASONIC CORP1
Top patents by PatentIndex Score
12 records- 0193US4858071AElectronic circuit apparatusNISSAN MOTOR·Filed 1988·Granted Aug 15, 1989·91 cites·12 claims
- 0287US5038613AAngular rate detecting deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1990·Granted Aug 13, 1991·83 cites·4 claims
- 0385US5239868AAngular rate detecting deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Aug 31, 1993·75 cites·2 claims
- 0485US4843520AElectronic circuit moduleMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1988·Granted Jun 27, 1989·54 cites·14 claims
- 0577US7957502B2Method for scaling scattered ray intensity distribution in multi bulbs X-ray CT and multi bulbs X-ray CT apparatusTOSHIBA KK·Filed 2008·Granted Jun 7, 2011·9 cites·20 claims
- 0674US6324482B1Sensor provided with adjusting functionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Nov 27, 2001·28 cites·9 claims
- 0769US8437520B2Medical image processor and medical image processing methodMANABE TAKAHIRO·Filed 2009·Granted May 7, 2013·9 cites·4 claims
- 0868US5014554AAngular rate sensorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1990·Granted May 14, 1991·32 cites·3 claims
- 0962US2024404039A1Determination device, determination system, determination method, program, and storage mediumTOSHIBA KK·Filed 2024·Application pending·0 cites
- 1059US8649582B2Plaque region extracting method and apparatus thereforMANABE TAKAHIRO·Filed 2012·Granted Feb 11, 2014·1 cites·13 claims
- 1136US2021279854A1Inspection terminal device, inspection device, inspection system, and inspection programTOSHIBA KK·Filed 2021·Application pending·0 cites
- 1230USRE41847ESensor provided with adjusting functionPANASONIC CORP·Filed 1998·Granted Oct 19, 2010·1 cites·11 claims
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