Inventor · disambiguated record
You Mimura
Also filed as: MIMURA YOU
1 granted patent·2 pending applications·0 citations·filing 2002–2010
14Inventor score
Technology areasG01B
Files withITOH TAKAHIRO2
Top patents by PatentIndex Score
3 records- 0134US8174757B2Wavelength determining apparatus, method and program for thin film thickness monitoring lightITOH TAKAHIRO·Filed 2010·Granted May 8, 2012·0 cites·11 claims
- 0229US2007223008A1Wavelength determining apparatus, method and program for thin film thickness monitoring lightITOH TAKAHIRO·Filed 2007·Application pending·0 cites
- 0325US2004032591A1Wavelength determining apparatus, method and program for thin film thickness monitoring lightFiled 2002·Application pending·0 cites
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