Inventor · disambiguated record
Hans-Jurgen Fleischer
Also filed as: FLEISCHER HANS-JUERGEN · FLEISCHER HANS-JURGEN
7 granted patents·1 pending application·40 citations·filing 2004–2014
82Inventor score
Technology areasG01R
Top patents by PatentIndex Score
8 records- 0180US7733108B2Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 8, 2010·9 cites·14 claims
- 0273US8692567B2Method for verifying a test substrate in a prober under defined thermal conditionsTEICH MICHAEL·Filed 2009·Granted Apr 8, 2014·6 cites·16 claims
- 0372US8278951B2Probe station for testing semiconductor substrates and comprising EMI shieldingKANEV STOJAN·Filed 2007·Granted Oct 2, 2012·8 cites·12 claims
- 0463US7652491B2Probe support with shield for the examination of test substrates under use of probe supportsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jan 26, 2010·4 cites·12 claims
- 0562US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 0655US9632108B2Method for verifying a test substrate in a prober under defined thermal conditionsCASCADE MICROTECH INC·Filed 2014·Granted Apr 25, 2017·0 cites·22 claims
- 0755US7560942B2Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatusSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jul 14, 2009·2 cites·18 claims
- 0843US2009021275A1Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
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