Inventor · disambiguated record
Armin Heinz Hayn
Also filed as: HAYN ARMIN · HAYN ARMIN HEINZ
7 granted patents·1 pending application·44 citations·filing 2001–2025
82Inventor score
Files withLEO ELECTRON MICROSCOPY LTD2ZEISS CARL SMT LTD2ALBIEZ MICHAEL1HAYN ARMIN HEINZ1PREIKSZAS DIRK1
Top patents by PatentIndex Score
8 records- 0185US8405045B2Particle beam device with deflection systemPREIKSZAS DIRK·Filed 2011·Granted Mar 26, 2013·8 cites·20 claims
- 0279US6781124B2Particle detectorsLEO ELECTRON MICROSCOPY LTD·Filed 2001·Granted Aug 24, 2004·17 cites·19 claims
- 0367US6943352B2Particle detectorsZEISS CARL SMT LTD·Filed 2004·Granted Sep 13, 2005·7 cites·11 claims
- 0467US2025385067A1Method for operating a particle beam apparatus, computer program product and particle beam apparatus for carrying out the methodZEISS CARL MICROSCOPY GMBH·Filed 2025·Application pending·0 cites
- 0566US6888140B2Particle detectorsLEO ELECTRON MICROSCOPY LTD·Filed 2003·Granted May 3, 2005·8 cites·21 claims
- 0657US8890444B2Electron gun used in particle beam deviceHAYN ARMIN HEINZ·Filed 2009·Granted Nov 18, 2014·2 cites·36 claims
- 0751US8131102B2Method for processing a digital gray value image so that a reduced image noise and simultaneously a higher image sharpness is achievedALBIEZ MICHAEL·Filed 2007·Granted Mar 6, 2012·2 cites·13 claims
- 0848US7777195B2Charged particle beam instrument and method of detecting charged particlesZEISS CARL SMT LTD·Filed 2007·Granted Aug 17, 2010·0 cites·18 claims
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