Inventor · disambiguated record
Jau-Wen Chen
Also filed as: CHEN JAU-WEN
13 granted patents·152 citations·filing 1999–2012
91Inventor score
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13 records- 0193US7582938B2I/O and power ESD protection circuits by enhancing substrate-bias in deep-submicron CMOS processLSI CORP·Filed 2005·Granted Sep 1, 2009·28 cites·8 claims
- 0285US9172241B2Electrostatic discharge protection circuit having high allowable power-up slew rateCHEN JAU-WEN·Filed 2012·Granted Oct 27, 2015·7 cites·21 claims
- 0382US7119405B2Implantation method to improve ESD robustness of thick gate-oxide grounded-gate NMOSFET's in deep-submicron CMOS technologiesLSI LOGIC CORP·Filed 2005·Granted Oct 10, 2006·14 cites·3 claims
- 0482US6979869B2Substrate-biased I/O and power ESD protection circuits in deep-submicron twin-well processLSI LOGIC CORP·Filed 2003·Granted Dec 27, 2005·43 cites·18 claims
- 0576US8269280B2I/O and power ESD protection circuits by enhancing substrate-bias in deep-submicron CMOS processCHEN JAU-WEN·Filed 2011·Granted Sep 18, 2012·4 cites·20 claims
- 0671US7375543B2Electrostatic discharge testingLSI CORP·Filed 2005·Granted May 20, 2008·6 cites·17 claims
- 0770US6347026B1Input and power protection circuit implemented in a complementary metal oxide semiconductor process using salicidesLSI LOGIC CORP·Filed 1999·Granted Feb 12, 2002·37 cites·6 claims
- 0868US7763908B2Design of silicon-controlled rectifier by considering electrostatic discharge robustness in human-body model and charged-device model devicesLSI CORP·Filed 2005·Granted Jul 27, 2010·4 cites·5 claims
- 0968US7317228B2Optimization of NMOS drivers using self-ballasting ESD protection technique in fully silicided CMOS processLSI LOGIC CORP·Filed 2005·Granted Jan 8, 2008·4 cites·9 claims
- 1065US7948036B2I/O and power ESD protection circuits by enhancing substrate-bias in deep-submicron CMOS processLSI CORP·Filed 2009·Granted May 24, 2011·2 cites·11 claims
- 1156US7551414B2Electrostatic discharge series protectionLSI CORP·Filed 2005·Granted Jun 23, 2009·1 cites·6 claims
- 1253US7777996B2Circuit protection systemLSI CORP·Filed 2005·Granted Aug 17, 2010·1 cites·18 claims
- 1352US7379281B2Bias for electrostatic discharge protectionLSI LOGIC CORP·Filed 2005·Granted May 27, 2008·1 cites·1 claims
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