Inventor · disambiguated record
Kenneth M. Loewenstern
Also filed as: LOEWENSTERN KENNETH · LOEWENSTERN KENNETH M
7 granted patents·146 citations·filing 1974–1984
87Inventor score
Top patents by PatentIndex Score
7 records- 0191US4146834AAdmittance measuring system for monitoring the condition of materialsDREXELBROOK CONTROLS·Filed 1976·Granted Mar 27, 1979·52 cites·35 claims
- 0280US4232300ALevel measuring system using admittance sensingDREXELBROOK CONTROLS·Filed 1978·Granted Nov 4, 1980·28 cites·12 claims
- 0373US3993947AAdmittance measuring system for monitoring the condition of materialsDREXELBROOK CONTROLS·Filed 1974·Granted Nov 23, 1976·19 cites·28 claims
- 0465US4301681AMethod of using capacitor probe with a semiconductive electrodeDREXELBROOK CONTROLS·Filed 1979·Granted Nov 24, 1981·17 cites·19 claims
- 0553US4428026ATwo layer probeDREXELBROOK CONTROLS·Filed 1981·Granted Jan 24, 1984·14 cites·19 claims
- 0650US4511948ATwo layer probeDREXELBROOK CONTROLS·Filed 1984·Granted Apr 16, 1985·12 cites·10 claims
- 0728US4531416APressure transducerAMETEK INC·Filed 1983·Granted Jul 30, 1985·4 cites·8 claims
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