Inventor · disambiguated record
Mutsumi Kano
Also filed as: KANO MUTSUMI
2 granted patents·76 citations·filing 1998–2002
67Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0183US6646455B2Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matterMITSUBISHI DENKI KABSUHIKI KAI·Filed 1998·Granted Nov 11, 2003·52 cites·14 claims
- 0282US6888344B2Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matterMITSUBISHI ELECTRIC CORP·Filed 2002·Granted May 3, 2005·24 cites·5 claims
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