Inventor · disambiguated record
Jong-Sig Lee
Also filed as: LEE JONG S · LEE JONG-SIG
2 granted patents·5 pending applications·33 citations·filing 1999–2021
54Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4IAC IN NAT UNIV CHUNGNAM1OSAN COLLEGE1SEOUL NAT UNIV R&DB FOUNDATION1
Top patents by PatentIndex Score
7 records- 0162US6293026B1Method of measuring height of foot archOSAN COLLEGE·Filed 1999·Granted Sep 25, 2001·33 cites·1 claims
- 0252US2022140418A1In-situ x-ray diffraction analysis apparatus including peltier-type temperature control unit and analyzing method using the sameSEOUL NAT UNIV R&DB FOUNDATION·Filed 2021·Application pending·0 cites
- 0348US10876980B2Analysis apparatus interlocking in-situ x-ray diffraction and potentiostat and analyzing methods using the sameIAC IN NAT UNIV CHUNGNAM·Filed 2019·Granted Dec 29, 2020·0 cites·10 claims
- 0444US2005041778A1Micro-diffraction system and method of analyzing sample using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 0543US2004228437A1In-situ monitoring system for bonding process and method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 0643US2005084066A1X-ray diffractometer and method of correcting measurement position thereofSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 0735US2004228580A1Optical moduleSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →