Inventor · disambiguated record
Yutaka Kitagawara
Also filed as: KITAGAWARA YUTAKA
9 granted patents·71 citations·filing 1991–2006
88Inventor score
Files withSHINETSU HANDOTAI KK9
Top patents by PatentIndex Score
9 records- 0163US7718446B2Evaluation method for crystal defect in silicon single crystal waferSHINETSU HANDOTAI KK·Filed 2006·Granted May 18, 2010·2 cites·12 claims
- 0251US5386118AMethod and apparatus for determination of interstitial oxygen concentration in silicon single crystalSHINETSU HANDOTAI KK·Filed 1993·Granted Jan 31, 1995·10 cites·5 claims
- 0344US5612539AMethod of evaluating lifetime related quality of semiconductor surfaceSHINETSU HANDOTAI KK·Filed 1995·Granted Mar 18, 1997·11 cites·16 claims
- 0444US5444246ADetermining carbon concentration in silicon single crystal by FT-IRSHINETSU HANDOTAI KK·Filed 1993·Granted Aug 22, 1995·11 cites·26 claims
- 0543US5209811AMethod for heat-treating gallium arsenide monocrystalsSHINETSU HANDOTAI KK·Filed 1991·Granted May 11, 1993·7 cites·1 claims
- 0642US5841532AMethod for evaluating oxygen concentrating in semiconductor silicon single crystalSHINETSU HANDOTAI KK·Filed 1997·Granted Nov 24, 1998·10 cites·16 claims
- 0741US5302832AMethod for evaluation of spatial distribution of deep level concentration in semiconductor crystalSHINETSU HANDOTAI KK·Filed 1992·Granted Apr 12, 1994·9 cites·1 claims
- 0836US5533387AMethod of evaluating silicon wafersSHINETSU HANDOTAI KK·Filed 1995·Granted Jul 9, 1996·6 cites·3 claims
- 0933US5228927AMethod for heat-treating gallium arsenide monocrystalsSHINETSU HANDOTAI KK·Filed 1991·Granted Jul 20, 1993·5 cites·1 claims
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