Assignee

UNITED MICROLELECTRONICS CORP

TW·1 granted patent·1 pending application·5 citations·filing 1999–2009

Technology mixH10P1 H10W1

Top patents by PatentIndex Score

2 records

0141US2010308220A1Inspection structure and method for in-line monitoring waferUNITED MICROLELECTRONICS CORP·Filed 2009·Application pending·0 cites
0230US6133117AMethod of forming trench isolation for high voltage deviceUNITED MICROLELECTRONICS CORP·Filed 1999·Granted Oct 17, 2000·5 cites·14 claims

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