Assignee

SCHEINER DAVID

IL·1 granted patent·23 citations·filing 2008–2008

Technology mixG01B1 G01R1 G06T1 H10P1

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0191US8531679B2Optical system and method for measurement of one or more parameters of via-holesSCHEINER DAVID·Filed 2008·Granted Sep 10, 2013·23 cites·28 claims

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