Assignee
YASUI TAKAHIRO
JP·3 granted patents·2 citations·filing 2008–2010
Top patents by PatentIndex Score
3 records- 0154US8286045B2Test apparatus and test methodYASUI TAKAHIRO·Filed 2010·Granted Oct 9, 2012·2 cites·7 claims
- 0234US8074134B2Pattern generator and memory testing device using the sameYASUI TAKAHIRO·Filed 2008·Granted Dec 6, 2011·0 cites·10 claims
- 0333US8423840B2Pattern generatorYASUI TAKAHIRO·Filed 2008·Granted Apr 16, 2013·0 cites·9 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →