Assignee
WASHIO KENICHI
JP·4 granted patents·1 pending application·18 citations·filing 2010–2012
Top patents by PatentIndex Score
5 records- 0185US8525539B2Electrical connecting apparatus and testing system using the sameWASHIO KENICHI·Filed 2010·Granted Sep 3, 2013·8 cites·13 claims
- 0281US8253433B2Testing apparatus for integrated circuitWASHIO KENICHI·Filed 2010·Granted Aug 28, 2012·6 cites·14 claims
- 0363US8278965B2Inspection apparatusWASHIO KENICHI·Filed 2010·Granted Oct 2, 2012·3 cites·6 claims
- 0454US8471586B2Wafer prober for semiconductor inspection and inspection methodWASHIO KENICHI·Filed 2010·Granted Jun 25, 2013·1 cites·10 claims
- 0538US2013187676A1Inspection apparatusWASHIO KENICHI·Filed 2012·Application pending·0 cites
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