Assignee
TRANSLARITY INC
US·10 granted patents·7 pending applications·1 citations·filing 2013–2023
Top patents by PatentIndex Score
17 records- 0172US11997789B2Redistribution plateTRANSLARITY INC·Filed 2022·Granted May 28, 2024·0 cites·1 claims
- 0265US11510318B2Redistribution plateTRANSLARITY INC·Filed 2021·Granted Nov 22, 2022·0 cites·1 claims
- 0363US9494618B2Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methodsTRANSLARITY INC·Filed 2013·Granted Nov 15, 2016·1 cites·16 claims
- 0461US2017219627A1Wafer prober integrated with full-wafer contactorTRANSLARITY INC·Filed 2017·Application pending·0 cites
- 0560US12429121B2Reducing position repeatability error in linear motion systemsTRANSLARITY INC·Filed 2023·Granted Sep 30, 2025·0 cites·13 claims
- 0660US10571489B2Wafer testing system and associated methods of use and manufactureTRANSLARITY INC·Filed 2017·Granted Feb 25, 2020·0 cites·17 claims
- 0758US9612278B2Wafer prober integrated with full-wafer contacterTRANSLARITY INC·Filed 2015·Granted Apr 4, 2017·0 cites·22 claims
- 0857US2018003737A1Designed asperity contactors, including nanospikes, for semiconductor test, and associated systems and methodsTRANSLARITY INC·Filed 2017·Application pending·0 cites
- 0956US9612259B2Wafer testing system and associated methods of use and manufactureTRANSLARITY INC·Filed 2014·Granted Apr 4, 2017·0 cites·9 claims
- 1053US9733272B2Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methodsTRANSLARITY INC·Filed 2016·Granted Aug 15, 2017·0 cites·24 claims
- 1153US9222965B2Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methodsTRANSLARITY INC·Filed 2014·Granted Dec 29, 2015·0 cites·22 claims
- 1246US9176186B2Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposedTRANSLARITY INC·Filed 2013·Granted Nov 3, 2015·0 cites·14 claims
- 1336US2017023616A1Interdigitized polysymmetric fanouts, and associated systems and methodsTRANSLARITY INC·Filed 2016·Application pending·0 cites
- 1433US2017292992A1Semiconductor tests using interposers, and associated systems and methodsTRANSLARITY INC·Filed 2016·Application pending·0 cites
- 1533US2017016954A1Systems and methods for generating and preserving vacuum between semiconductor wafer and wafer translatorTRANSLARITY INC·Filed 2016·Application pending·0 cites
- 1632US2017023642A1Lost motion gasket for semiconductor test, and associated systems and methodsTRANSLARITY INC·Filed 2016·Application pending·0 cites
- 1728US2017023617A1Shaping of contact structures for semiconductor test, and associated systems and methodsTRANSLARITY INC·Filed 2016·Application pending·0 cites
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