Assignee
TANASE KENJI
JP·1 granted patent·1 pending application·3 citations·filing 2005–2008
Top patents by PatentIndex Score
2 records- 0172US8536568B2Display deviceTANASE KENJI·Filed 2008·Granted Sep 17, 2013·3 cites·6 claims
- 0244US2005244570A1Deposition thickness measuring method, material layer forming method, deposition thickness measuring apparatus, and material layer forming apparatusTANASE KENJI·Filed 2005·Application pending·0 cites
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