Assignee
TAKAI HIROSHI
JP·7 granted patents·6 citations·filing 2005–2011
Top patents by PatentIndex Score
7 records- 0175US8643366B2Magnetic resonance imaging apparatus and magnetic resonance imaging methodTAKAI HIROSHI·Filed 2011·Granted Feb 4, 2014·3 cites·7 claims
- 0269US8647174B2Semiconductor wafer polishing method and polishing pad shaping jigTAKAI HIROSHI·Filed 2010·Granted Feb 11, 2014·2 cites·9 claims
- 0354US8545712B2Semiconductor wafer manufacturing methodTAKAI HIROSHI·Filed 2008·Granted Oct 1, 2013·1 cites·6 claims
- 0448US9301704B2Magnetic resonance imaging system for non-contrast MRA and magnetic resonance signal acquisition method employed by the sameTAKAI HIROSHI·Filed 2005·Granted Apr 5, 2016·0 cites·12 claims
- 0544US9073173B2Method for shape modification of polishing padTAKAI HIROSHI·Filed 2010·Granted Jul 7, 2015·0 cites·8 claims
- 0643US8633694B2Magnetic resonance imaging apparatusTAKAI HIROSHI·Filed 2010·Granted Jan 21, 2014·0 cites·6 claims
- 0741US8396277B2Magnetic resonance imaging apparatusTAKAI HIROSHI·Filed 2011·Granted Mar 12, 2013·0 cites·9 claims
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