Assignee
SALNIK ALEX
US·2 granted patents·1 pending application·2 citations·filing 2007–2011
Top patents by PatentIndex Score
3 records- 0163US8120776B1Measuring characteristics of ultra-shallow junctionsSALNIK ALEX·Filed 2009·Granted Feb 21, 2012·1 cites·14 claims
- 0261US8535957B1Dopant metrology with information feedforward and feedbackSALNIK ALEX·Filed 2011·Granted Sep 17, 2013·1 cites·24 claims
- 0345US2008074668A1Modulated optical reflectance measurement system with enhanced sensitivitySALNIK ALEX·Filed 2007·Application pending·0 cites
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