Assignee

SAKAI KEI

JP·2 granted patents·6 citations·filing 2009–2010

Technology mixG06T2 H01J2 G01B1 G03F1 H10P1

Top patents by PatentIndex Score

2 records

0176US9024272B2Pattern measuring apparatusSAKAI KEI·Filed 2010·Granted May 5, 2015·6 cites·4 claims
0255US8478078B2Pattern-searching condition determining method, and pattern-searching condition setting deviceSAKAI KEI·Filed 2009·Granted Jul 2, 2013·0 cites·8 claims

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