Assignee
SAKAI HIDEHISA
JP·2 granted patents·1 pending application·10 citations·filing 2007–2010
Top patents by PatentIndex Score
3 records- 0177US8190378B2Crack growth evaluation apparatus, crack growth evaluation method, and recording medium recording crack growth evaluation programSAKAI HIDEHISA·Filed 2008·Granted May 29, 2012·8 cites·8 claims
- 0269US8204699B2Analyzing apparatus, analyzing method, and computer-readable recording medium storing an analyzing programSAKAI HIDEHISA·Filed 2010·Granted Jun 19, 2012·2 cites·9 claims
- 0342US2008004855A1Design support apparatus, design support method, and design support programSAKAI HIDEHISA·Filed 2007·Application pending·0 cites
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