Assignee
RIKA ELECTRONICS INTERNATIONAL
US·8 granted patents·576 citations·filing 1998–2004
Top patents by PatentIndex Score
8 records- 0196US6053777ACoaxial contact assembly apparatusRIKA ELECTRONICS INTERNATIONAL·Filed 1998·Granted Apr 25, 2000·225 cites·11 claims
- 0291US6685492B2Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational conditionRIKA ELECTRONICS INTERNATIONAL·Filed 2002·Granted Feb 3, 2004·68 cites·19 claims
- 0391US6159056AElectrical contact assembly for interconnecting test apparatus and the likeRIKA ELECTRONICS INTERNATIONAL·Filed 1999·Granted Dec 12, 2000·100 cites·7 claims
- 0489US6992496B2Apparatus for interfacing electronic packages and test equipmentRIKA ELECTRONICS INTERNATIONAL·Filed 2003·Granted Jan 31, 2006·56 cites·29 claims
- 0588US6275054B1Electrical contact systemRIKA ELECTRONICS INTERNATIONAL·Filed 1999·Granted Aug 14, 2001·58 cites·14 claims
- 0684US6652326B2Contact apparatus particularly useful with test equipmentRIKA ELECTRONICS INTERNATIONAL·Filed 2001·Granted Nov 25, 2003·34 cites·12 claims
- 0774US7362114B2Apparatus for interfacing electronic packages and test equipmentRIKA ELECTRONICS INTERNATIONAL·Filed 2004·Granted Apr 22, 2008·17 cites·17 claims
- 0871US6667629B2Electrical test probes and methods of making the sameRIKA ELECTRONICS INTERNATIONAL·Filed 2002·Granted Dec 23, 2003·18 cites·29 claims
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