Assignee
REYNAUD PATRICK
FR·3 granted patents·1 pending application·2 citations·filing 2007–2012
Top patents by PatentIndex Score
4 records- 0161US8658514B2Method for manufacturing a semiconductor-on-insulator structure having low electrical losses, and corresponding structureREYNAUD PATRICK·Filed 2012·Granted Feb 25, 2014·1 cites·18 claims
- 0254US8962492B2Method to thin a silicon-on-insulator substrateREYNAUD PATRICK·Filed 2010·Granted Feb 24, 2015·1 cites·14 claims
- 0343US2008268621A1Method for manufacturing compound material wafer and corresponding compound material waferREYNAUD PATRICK·Filed 2007·Application pending·0 cites
- 0436US9244019B2Method for measuring defects in a silicon substrate by applying a heat treatment which consolidates and enlarges the defectsREYNAUD PATRICK·Filed 2012·Granted Jan 26, 2016·0 cites·8 claims
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