Assignee
POURKERAMATI ALI
2 granted patents·16 citations·filing 2003–2006
Top patents by PatentIndex Score
2 records- 0176US7781890B2Structure and method for parallel testing of dies on a semiconductor waferPOURKERAMATI ALI·Filed 2006·Granted Aug 24, 2010·4 cites·43 claims
- 0271US7173444B2Structure and method for parallel testing of dies on a semiconductor waferPOURKERAMATI ALI·Filed 2003·Granted Feb 6, 2007·12 cites·21 claims
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