Assignee
OSHIMA YOSHIMASA
JP·5 granted patents·1 pending application·3 citations·filing 2009–2013
Technology mixG01N6
Top patents by PatentIndex Score
6 records- 0178US8264679B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2012·Granted Sep 11, 2012·2 cites·18 claims
- 0269US8120766B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2009·Granted Feb 21, 2012·1 cites·17 claims
- 0362US8934092B2Surface defect inspection method and apparatusOSHIMA YOSHIMASA·Filed 2013·Granted Jan 13, 2015·0 cites·14 claims
- 0460US8705026B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2012·Granted Apr 22, 2014·0 cites·26 claims
- 0558US8400629B2Surface defect inspection method and apparatusOSHIMA YOSHIMASA·Filed 2011·Granted Mar 19, 2013·0 cites·15 claims
- 0650US2010225904A1Defect Inspection Tool For Sample Surface And Defect Detection Method ThereforOSHIMA YOSHIMASA·Filed 2010·Application pending·0 cites
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